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Title: Gap and stripline combined monitor

Abstract

A combined gap and stripline monitor device for measuring the intensity and position of a charged particle beam bunch in a beam pipe of a synchrotron radiation facility is disclosed. The monitor has first and second beam pipe portions with an axial gap therebetween. An outer pipe cooperates with the first beam pipe portion to form a gap enclosure, while inner strips cooperate with the first beam pipe portion to form a stripline monitor, with the stripline length being the same as the gap enclosure length. 4 figs.

Inventors:
Issue Date:
OSTI Identifier:
7146491
Patent Number(s):
4607194
Application Number:
PPN: US 6-580981
Assignee:
Dept. of Energy, Washington, DC (United States)
DOE Contract Number:  
AC03-82ER13000
Resource Type:
Patent
Resource Relation:
Patent File Date: 16 Feb 1984
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BEAM MONITORS; DESIGN; SYNCHROTRON RADIATION SOURCES; ACCELERATORS; BEAM POSITION; MEASURING INSTRUMENTS; MONITORS; RADIATION SOURCES; 430300* - Particle Accelerators- Auxiliaries & Components

Citation Formats

Yin, Y. Gap and stripline combined monitor. United States: N. p., 1986. Web.
Yin, Y. Gap and stripline combined monitor. United States.
Yin, Y. Tue . "Gap and stripline combined monitor". United States.
@article{osti_7146491,
title = {Gap and stripline combined monitor},
author = {Yin, Y},
abstractNote = {A combined gap and stripline monitor device for measuring the intensity and position of a charged particle beam bunch in a beam pipe of a synchrotron radiation facility is disclosed. The monitor has first and second beam pipe portions with an axial gap therebetween. An outer pipe cooperates with the first beam pipe portion to form a gap enclosure, while inner strips cooperate with the first beam pipe portion to form a stripline monitor, with the stripline length being the same as the gap enclosure length. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 19 00:00:00 EDT 1986},
month = {Tue Aug 19 00:00:00 EDT 1986}
}

Patent:
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