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Title: Control for monitoring thickness of high temperature refractory

Abstract

This invention teaches an improved monitoring device for detecting the changes in thickness of high-temperature refractory, the device consists of a probe having at least two electrically conductive generally parallel elements separated by a dielectric material. The probe is implanted or embedded directly in the refractory and is elongated to extend in line with the refractory thickness to be measured. Electrical inputs to the conductive elements provide that either or both the electrical conductance or capacitance can be found, so that charges over lapsed time periods can be compared in order to detect changes in the thickness of the refractory.

Inventors:
Issue Date:
OSTI Identifier:
7137312
Application Number:
ON: DE84005938
Assignee:
Dept. of Energy ERA-09-026738; EDB-84-085099
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 47 OTHER INSTRUMENTATION; REFRACTORIES; THICKNESS GAGES; DESIGN; DIELECTRIC MATERIALS; ELECTRIC CONTACTS; PROBES; ELECTRICAL EQUIPMENT; EQUIPMENT; MATERIALS; MEASURING INSTRUMENTS; 420500* - Engineering- Materials Testing; 440300 - Miscellaneous Instruments- (-1989)

Citation Formats

Caines, M.J. Control for monitoring thickness of high temperature refractory. United States: N. p., 1982. Web.
Caines, M.J. Control for monitoring thickness of high temperature refractory. United States.
Caines, M.J. Tue . "Control for monitoring thickness of high temperature refractory". United States.
@article{osti_7137312,
title = {Control for monitoring thickness of high temperature refractory},
author = {Caines, M.J.},
abstractNote = {This invention teaches an improved monitoring device for detecting the changes in thickness of high-temperature refractory, the device consists of a probe having at least two electrically conductive generally parallel elements separated by a dielectric material. The probe is implanted or embedded directly in the refractory and is elongated to extend in line with the refractory thickness to be measured. Electrical inputs to the conductive elements provide that either or both the electrical conductance or capacitance can be found, so that charges over lapsed time periods can be compared in order to detect changes in the thickness of the refractory.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1982},
month = {11}
}