Photo-ion spectrometer
Abstract
A thin film structure for providing predetermined electric field boundary conditions. A thin film configuration is disposed on an insulator substrate in a selected spatial pattern with substantially uniform electrically resistive character in each of the different areas of the spatial pattern.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7117649
- Patent Number(s):
- 5097125
- Application Number:
- PPN: US 7-045586
- Assignee:
- ARCH Development Corp., Chicago, IL (United States)
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 4 May 1987
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; SPECTROMETERS; DESIGN; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRICAL INSULATORS; SPATIAL DISTRIBUTION; THIN FILMS; DISTRIBUTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; FILMS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; 440800* - Miscellaneous Instrumentation- (1990-)
Citation Formats
Gruen, D M, Young, C E, and Pellin, M J. Photo-ion spectrometer. United States: N. p., 1992.
Web.
Gruen, D M, Young, C E, & Pellin, M J. Photo-ion spectrometer. United States.
Gruen, D M, Young, C E, and Pellin, M J. Tue .
"Photo-ion spectrometer". United States.
@article{osti_7117649,
title = {Photo-ion spectrometer},
author = {Gruen, D M and Young, C E and Pellin, M J},
abstractNote = {A thin film structure for providing predetermined electric field boundary conditions. A thin film configuration is disposed on an insulator substrate in a selected spatial pattern with substantially uniform electrically resistive character in each of the different areas of the spatial pattern.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1992},
month = {3}
}
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