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Title: Photo-ion spectrometer

Abstract

A thin film structure for providing predetermined electric field boundary conditions. A thin film configuration is disposed on an insulator substrate in a selected spatial pattern with substantially uniform electrically resistive character in each of the different areas of the spatial pattern.

Inventors:
; ;
Issue Date:
OSTI Identifier:
7117649
Patent Number(s):
5097125 A
Application Number:
PPN: US 7-045586
Assignee:
ARCH Development Corp., Chicago, IL (United States) PTO; EDB-94-090538
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 4 May 1987
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; SPECTROMETERS; DESIGN; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRICAL INSULATORS; SPATIAL DISTRIBUTION; THIN FILMS; DISTRIBUTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; FILMS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; 440800* - Miscellaneous Instrumentation- (1990-)

Citation Formats

Gruen, D.M., Young, C.E., and Pellin, M.J. Photo-ion spectrometer. United States: N. p., 1992. Web.
Gruen, D.M., Young, C.E., & Pellin, M.J. Photo-ion spectrometer. United States.
Gruen, D.M., Young, C.E., and Pellin, M.J. Tue . "Photo-ion spectrometer". United States.
@article{osti_7117649,
title = {Photo-ion spectrometer},
author = {Gruen, D.M. and Young, C.E. and Pellin, M.J.},
abstractNote = {A thin film structure for providing predetermined electric field boundary conditions. A thin film configuration is disposed on an insulator substrate in a selected spatial pattern with substantially uniform electrically resistive character in each of the different areas of the spatial pattern.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1992},
month = {3}
}