Diffraction encoded position measuring apparatus
Abstract
When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection. 3 figures.
- Inventors:
- Issue Date:
- Research Org.:
- Rockwell International Corp., Canoga Park, CA (United States)
- OSTI Identifier:
- 7083291
- Patent Number(s):
- 5050993
- Application Number:
- PPN: US 7-365990
- Assignee:
- Rockwell International Corporation, El Segundo, CA (United States)
- DOE Contract Number:
- AC03-86SF16499
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 14 Jun 1989
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; DISPLACEMENT GAGES; DESIGN; DIFFRACTION GRATINGS; DOPPLER EFFECT; LASER RADIATION; ULTRAVIOLET RADIATION; ELECTROMAGNETIC RADIATION; GRATINGS; MEASURING INSTRUMENTS; RADIATIONS; 440800* - Miscellaneous Instrumentation- (1990-)
Citation Formats
Tansey, R J. Diffraction encoded position measuring apparatus. United States: N. p., 1991.
Web.
Tansey, R J. Diffraction encoded position measuring apparatus. United States.
Tansey, R J. Tue .
"Diffraction encoded position measuring apparatus". United States.
@article{osti_7083291,
title = {Diffraction encoded position measuring apparatus},
author = {Tansey, R J},
abstractNote = {When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection. 3 figures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {9}
}
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