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Title: Amorphous silicon ionizing particle detectors

Abstract

Amorphous silicon ionizing particle detectors having a hydrogenated amorphous silicon (a--Si:H) thin film deposited via plasma assisted chemical vapor deposition techniques are utilized to detect the presence, position and counting of high energy ionizing particles, such as electrons, x-rays, alpha particles, beta particles and gamma radiation. 15 figs.

Inventors:
; ;
Issue Date:
OSTI Identifier:
7067899
Patent Number(s):
4785186 A
Application Number:
PPN: US 6-921302
Assignee:
Xerox Corp., Stamford, CT (United States) PTO; EDB-94-118204
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Resource Relation:
Patent File Date: 21 Oct 1986
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALPHA DETECTION; SI SEMICONDUCTOR DETECTORS; BETA DETECTION; ELECTRON DETECTION; GAMMA DETECTION; X-RAY DETECTION; AMORPHOUS STATE; IONIZING RADIATIONS; POSITION SENSITIVE DETECTORS; CHARGED PARTICLE DETECTION; DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; 440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments

Citation Formats

Street, R.A., Mendez, V.P., and Kaplan, S.N. Amorphous silicon ionizing particle detectors. United States: N. p., 1988. Web.
Street, R.A., Mendez, V.P., & Kaplan, S.N. Amorphous silicon ionizing particle detectors. United States.
Street, R.A., Mendez, V.P., and Kaplan, S.N. Tue . "Amorphous silicon ionizing particle detectors". United States.
@article{osti_7067899,
title = {Amorphous silicon ionizing particle detectors},
author = {Street, R.A. and Mendez, V.P. and Kaplan, S.N.},
abstractNote = {Amorphous silicon ionizing particle detectors having a hydrogenated amorphous silicon (a--Si:H) thin film deposited via plasma assisted chemical vapor deposition techniques are utilized to detect the presence, position and counting of high energy ionizing particles, such as electrons, x-rays, alpha particles, beta particles and gamma radiation. 15 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1988},
month = {11}
}