Wavelength meter having elliptical wedge
Abstract
A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10[sup 8]. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing. 7 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7045235
- Patent Number(s):
- 5168324
- Application Number:
- PPN: US 7-298812
- Assignee:
- Dept. of Energy, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 18 Jan 1989
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; LASER RADIATION; WAVELENGTHS; METERS; DESIGN; INTERFEROMETERS; PERFORMANCE; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; RADIATIONS; 426002* - Engineering- Lasers & Masers- (1990-)
Citation Formats
Hackel, R P, and Feldman, M. Wavelength meter having elliptical wedge. United States: N. p., 1992.
Web.
Hackel, R P, & Feldman, M. Wavelength meter having elliptical wedge. United States.
Hackel, R P, and Feldman, M. Tue .
"Wavelength meter having elliptical wedge". United States.
@article{osti_7045235,
title = {Wavelength meter having elliptical wedge},
author = {Hackel, R P and Feldman, M},
abstractNote = {A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10[sup 8]. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing. 7 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1992},
month = {12}
}