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Title: Wavelength meter having elliptical wedge

Abstract

A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10[sup 8]. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing. 7 figs.

Inventors:
;
Issue Date:
OSTI Identifier:
7045235
Patent Number(s):
5168324 A
Application Number:
PPN: US 7-298812
Assignee:
Dept. of Energy, Washington, DC (United States) PTO; EDB-94-090248
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Resource Relation:
Patent File Date: 18 Jan 1989
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; LASER RADIATION; WAVELENGTHS; METERS; DESIGN; INTERFEROMETERS; PERFORMANCE; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; RADIATIONS; 426002* - Engineering- Lasers & Masers- (1990-)

Citation Formats

Hackel, R.P., and Feldman, M. Wavelength meter having elliptical wedge. United States: N. p., 1992. Web.
Hackel, R.P., & Feldman, M. Wavelength meter having elliptical wedge. United States.
Hackel, R.P., and Feldman, M. Tue . "Wavelength meter having elliptical wedge". United States.
@article{osti_7045235,
title = {Wavelength meter having elliptical wedge},
author = {Hackel, R.P. and Feldman, M.},
abstractNote = {A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10[sup 8]. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing. 7 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1992},
month = {12}
}