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Title: Characterization of compounds by time-of-flight measurement utilizing random fast ions

Abstract

An apparatus is described for characterizing the mass of sample and daughter particles, comprising a source for providing sample ions; a fragmentation region wherein a fraction of the sample ions may fragment to produce daughter ion particles; an electrostatic field region held at a voltage level sufficient to effect ion-neutral separation and ion-ion separation of fragments from the same sample ion and to separate ions of different kinetic energy; a detector system for measuring the relative arrival times of particles; and processing means operatively connected to the detector system to receive and store the relative arrival times and operable to compare the arrival times with times detected at the detector when the electrostatic field region is held at a different voltage level and to thereafter characterize the particles. Sample and daughter particles are characterized with respect to mass and other characteristics by detecting at a particle detector the relative time of arrival for fragments of a sample ion at two different electrostatic voltage levels. The two sets of particle arrival times are used in conjunction with the known altered voltage levels to mathematically characterize the sample and daughter fragments. In an alternative embodiment the present invention may be used asmore » a detector for a conventional mass spectrometer. In this embodiment, conventional mass spectrometry analysis is enhanced due to further mass resolving of the detected ions. 8 figs.« less

Inventors:
Issue Date:
OSTI Identifier:
7019941
Patent Number(s):
4818862 A
Application Number:
PPN: US 7-110856
Assignee:
Iowa State Univ. Research Foundation, Inc., Ames, IA (United States) PTO; EDB-94-117226
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Patent
Resource Relation:
Patent File Date: 21 Oct 1987
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION; TIME-OF-FLIGHT MASS SPECTROMETERS; DESIGN; SAMPLE PREPARATION; DATA PROCESSING; IONIZATION; MASS SPECTROSCOPY; DYNAMIC MASS SPECTROMETERS; MASS SPECTROMETERS; MEASURING INSTRUMENTS; PROCESSING; SPECTROMETERS; SPECTROSCOPY; TIME-OF-FLIGHT SPECTROMETERS; 400102* - Chemical & Spectral Procedures; 440800 - Miscellaneous Instrumentation- (1990-)

Citation Formats

Conzemius, R.J. Characterization of compounds by time-of-flight measurement utilizing random fast ions. United States: N. p., 1989. Web.
Conzemius, R.J. Characterization of compounds by time-of-flight measurement utilizing random fast ions. United States.
Conzemius, R.J. Tue . "Characterization of compounds by time-of-flight measurement utilizing random fast ions". United States.
@article{osti_7019941,
title = {Characterization of compounds by time-of-flight measurement utilizing random fast ions},
author = {Conzemius, R.J.},
abstractNote = {An apparatus is described for characterizing the mass of sample and daughter particles, comprising a source for providing sample ions; a fragmentation region wherein a fraction of the sample ions may fragment to produce daughter ion particles; an electrostatic field region held at a voltage level sufficient to effect ion-neutral separation and ion-ion separation of fragments from the same sample ion and to separate ions of different kinetic energy; a detector system for measuring the relative arrival times of particles; and processing means operatively connected to the detector system to receive and store the relative arrival times and operable to compare the arrival times with times detected at the detector when the electrostatic field region is held at a different voltage level and to thereafter characterize the particles. Sample and daughter particles are characterized with respect to mass and other characteristics by detecting at a particle detector the relative time of arrival for fragments of a sample ion at two different electrostatic voltage levels. The two sets of particle arrival times are used in conjunction with the known altered voltage levels to mathematically characterize the sample and daughter fragments. In an alternative embodiment the present invention may be used as a detector for a conventional mass spectrometer. In this embodiment, conventional mass spectrometry analysis is enhanced due to further mass resolving of the detected ions. 8 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1989},
month = {4}
}