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Title: Time-of-flight direct recoil ion scattering spectrometer

A time-of-flight direct recoil and ion scattering spectrometer beam line is disclosed. The beam line includes an ion source which injects ions into pulse deflection regions and separated by a drift space. A final optics stage includes an ion lens and deflection plate assembly. The ion pulse length and pulse interval are determined by computerized adjustment of the timing between the voltage pulses applied to the pulsed deflection regions. 23 figs.
Inventors:
; ;
Issue Date:
OSTI Identifier:
6928006
Assignee:
ARCH Development Corp., Chicago, IL (United States) PTO; EDB-94-154640
Patent Number(s):
US 5347126; A
Application Number:
PPN: US 7-908282
Contract Number:
W-31109-ENG-38
Resource Relation:
Patent File Date: 2 Jul 1992
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; TIME-OF-FLIGHT SPECTROMETERS; DESIGN; BEAM INJECTION; OPTICAL SYSTEMS; PULSE TECHNIQUES; MEASURING INSTRUMENTS; SPECTROMETERS 440800* -- Miscellaneous Instrumentation-- (1990-)