Time-of-flight direct recoil ion scattering spectrometer
Abstract
A time-of-flight direct recoil and ion scattering spectrometer beam line is disclosed. The beam line includes an ion source which injects ions into pulse deflection regions and separated by a drift space. A final optics stage includes an ion lens and deflection plate assembly. The ion pulse length and pulse interval are determined by computerized adjustment of the timing between the voltage pulses applied to the pulsed deflection regions. 23 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 6928006
- Patent Number(s):
- 5347126
- Application Number:
- PPN: US 7-908282
- Assignee:
- ARCH Development Corp., Chicago, IL (United States)
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2 Jul 1992
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; TIME-OF-FLIGHT SPECTROMETERS; DESIGN; BEAM INJECTION; OPTICAL SYSTEMS; PULSE TECHNIQUES; MEASURING INSTRUMENTS; SPECTROMETERS; 440800* - Miscellaneous Instrumentation- (1990-)
Citation Formats
Krauss, A R, Gruen, D M, and Lamich, G J. Time-of-flight direct recoil ion scattering spectrometer. United States: N. p., 1994.
Web.
Krauss, A R, Gruen, D M, & Lamich, G J. Time-of-flight direct recoil ion scattering spectrometer. United States.
Krauss, A R, Gruen, D M, and Lamich, G J. Tue .
"Time-of-flight direct recoil ion scattering spectrometer". United States.
@article{osti_6928006,
title = {Time-of-flight direct recoil ion scattering spectrometer},
author = {Krauss, A R and Gruen, D M and Lamich, G J},
abstractNote = {A time-of-flight direct recoil and ion scattering spectrometer beam line is disclosed. The beam line includes an ion source which injects ions into pulse deflection regions and separated by a drift space. A final optics stage includes an ion lens and deflection plate assembly. The ion pulse length and pulse interval are determined by computerized adjustment of the timing between the voltage pulses applied to the pulsed deflection regions. 23 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {9}
}
Search for the full text at the U.S. Patent and Trademark Office
Note: You will be redirected to the USPTO site, which may require a pop-up blocker to be deactivated to view the patent. If so, you will need to manually turn off your browser's pop-up blocker, typically found within the browser settings. (See DOE Patents FAQs for more information.)
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.