Negative ion beam injection apparatus with magnetic shield and electron removal means
Abstract
A negative ion source is constructed to produce H[sup [minus]] ions without using cesium. A high percentage of secondary electrons that typically accompany the extracted H[sup [minus]] are trapped and eliminated from the beam by permanent magnets in the initial stage of acceleration. Penetration of the magnetic field from the permanent magnets into the ion source is minimized. This reduces the destructive effect the magnetic field could have on negative ion production and extraction from the source. A beam expansion section in the extractor results in a strongly converged final beam. 16 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 6808527
- Patent Number(s):
- 5365070
- Application Number:
- PPN: US 7-875778
- Assignee:
- Univ. of California, Oakland, CA (United States)
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 29 Apr 1992
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Ta; HYDROGEN IONS 1 MINUS; ION SOURCES; DESIGN; BEAM EXTRACTION; ION BEAM INJECTION; ANIONS; BEAM INJECTION; CHARGED PARTICLES; HYDROGEN IONS; IONS; 661220* - Particle Beam Production & Handling; Targets- (1992-)
Citation Formats
Anderson, O A, Chan, C F, and Leung, K N. Negative ion beam injection apparatus with magnetic shield and electron removal means. United States: N. p., 1994.
Web.
Anderson, O A, Chan, C F, & Leung, K N. Negative ion beam injection apparatus with magnetic shield and electron removal means. United States.
Anderson, O A, Chan, C F, and Leung, K N. Tue .
"Negative ion beam injection apparatus with magnetic shield and electron removal means". United States.
@article{osti_6808527,
title = {Negative ion beam injection apparatus with magnetic shield and electron removal means},
author = {Anderson, O A and Chan, C F and Leung, K N},
abstractNote = {A negative ion source is constructed to produce H[sup [minus]] ions without using cesium. A high percentage of secondary electrons that typically accompany the extracted H[sup [minus]] are trapped and eliminated from the beam by permanent magnets in the initial stage of acceleration. Penetration of the magnetic field from the permanent magnets into the ion source is minimized. This reduces the destructive effect the magnetic field could have on negative ion production and extraction from the source. A beam expansion section in the extractor results in a strongly converged final beam. 16 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {11}
}
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