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Title: Analysis with electron microscope of multielement samples using pure element standards

Abstract

This disclosure describes a method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons. Simultaneously the electron dosage and x-ray intensities are measured for each sample of element to determine a ''K/sub AB/'' value to be used in the equation (I/sub A/I/sub B/) = K/sub AB/ (C/sub A//C/sub B/), where I is intensity and C is concentration for elements A and B. The multielement sample is exposed to determine the concentrations of the elements in the sample.

Inventors:
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
OSTI Identifier:
6803732
Application Number:
ON: DE87007290
Assignee:
Dept. of Energy
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION; ELECTRON MICROSCOPY; MULTI-ELEMENT ANALYSIS; ELECTRON MICROSCOPES; X-RAY EMISSION ANALYSIS; APERTURES; ELECTRON BEAMS; ELECTRON GUNS; SAMPLE HOLDERS; BEAMS; CHEMICAL ANALYSIS; LEPTON BEAMS; MICROSCOPES; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; OPENINGS; PARTICLE BEAMS; 400102* - Chemical & Spectral Procedures; 440300 - Miscellaneous Instruments- (-1989)

Citation Formats

King, W E. Analysis with electron microscope of multielement samples using pure element standards. United States: N. p., 1986. Web.
King, W E. Analysis with electron microscope of multielement samples using pure element standards. United States.
King, W E. Mon . "Analysis with electron microscope of multielement samples using pure element standards". United States.
@article{osti_6803732,
title = {Analysis with electron microscope of multielement samples using pure element standards},
author = {King, W E},
abstractNote = {This disclosure describes a method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons. Simultaneously the electron dosage and x-ray intensities are measured for each sample of element to determine a ''K/sub AB/'' value to be used in the equation (I/sub A/I/sub B/) = K/sub AB/ (C/sub A//C/sub B/), where I is intensity and C is concentration for elements A and B. The multielement sample is exposed to determine the concentrations of the elements in the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1986},
month = {1}
}