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Title: Beam characterization by wavefront sensor

Abstract

An apparatus and method are disclosed for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed. 21 figs.

Inventors:
; ;
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
678607
Patent Number(s):
5936720
Application Number:
PAN: 9-111,620
Assignee:
SNL; SCA: 440600; PA: EDB-99:085763; SN: 99002124521
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 10 Aug 1999
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; LASER RADIATION; MEASURING METHODS; MEASURING INSTRUMENTS; OPTICAL SYSTEMS; DESIGN; CHARGE-COUPLED DEVICES

Citation Formats

Neal, D R, Alford, W J, and Gruetzner, J K. Beam characterization by wavefront sensor. United States: N. p., 1999. Web.
Neal, D R, Alford, W J, & Gruetzner, J K. Beam characterization by wavefront sensor. United States.
Neal, D R, Alford, W J, and Gruetzner, J K. Tue . "Beam characterization by wavefront sensor". United States.
@article{osti_678607,
title = {Beam characterization by wavefront sensor},
author = {Neal, D R and Alford, W J and Gruetzner, J K},
abstractNote = {An apparatus and method are disclosed for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed. 21 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 10 00:00:00 EDT 1999},
month = {Tue Aug 10 00:00:00 EDT 1999}
}

Patent:
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