Aplanatic and quasi-aplanatic diffraction gratings
Abstract
A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for x-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnetification across the optical aperture. The grating may be sued, for example, in x-ray microscopes or telescopes of the imaging type and in x-ray microprobed. Increased spatial resolution and field of view may be realized in x-ray imaging. 5 figs.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Berkeley Lab., CA (USA)
- OSTI Identifier:
- 6771068
- Patent Number(s):
- -US-A6095715
- Assignee:
- LBNL; EDB-88-179309
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; GRATINGS; DESIGN; EQUATIONS; SPATIAL RESOLUTION; X-RAY DIFFRACTION; COHERENT SCATTERING; DIFFRACTION; RESOLUTION; SCATTERING 440300* -- Miscellaneous Instruments-- (-1989)
Citation Formats
Hettrick, M.C. Aplanatic and quasi-aplanatic diffraction gratings. United States: N. p., 1987.
Web.
Hettrick, M.C. Aplanatic and quasi-aplanatic diffraction gratings. United States.
Hettrick, M.C. Mon .
"Aplanatic and quasi-aplanatic diffraction gratings". United States.
@article{osti_6771068,
title = {Aplanatic and quasi-aplanatic diffraction gratings},
author = {Hettrick, M.C.},
abstractNote = {A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for x-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnetification across the optical aperture. The grating may be sued, for example, in x-ray microscopes or telescopes of the imaging type and in x-ray microprobed. Increased spatial resolution and field of view may be realized in x-ray imaging. 5 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {9}
}
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