Normal incidence x-ray mirror for chemical microanalysis
Abstract
An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- OSTI Identifier:
- 6761509
- Patent Number(s):
- 6081964
- Assignee:
- SNL; ERA-14-001599; EDB-88-186307
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B60 - VEHICLES IN GENERAL B60R - VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR
F - MECHANICAL ENGINEERING F16 - ENGINEERING ELEMENTS AND UNITS F16L - PIPES
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; MIRRORS; DESIGN; X-RAY EQUIPMENT; ABSORPTION; ELECTRON BEAMS; INVENTIONS; X-RAY FLUORESCENCE ANALYSIS; BEAMS; CHEMICAL ANALYSIS; EQUIPMENT; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; X-RAY EMISSION ANALYSIS; 440300* - Miscellaneous Instruments- (-1989)
Citation Formats
Carr, M J, and Romig, Jr, A D. Normal incidence x-ray mirror for chemical microanalysis. United States: N. p., 1987.
Web.
Carr, M J, & Romig, Jr, A D. Normal incidence x-ray mirror for chemical microanalysis. United States.
Carr, M J, and Romig, Jr, A D. Wed .
"Normal incidence x-ray mirror for chemical microanalysis". United States.
@article{osti_6761509,
title = {Normal incidence x-ray mirror for chemical microanalysis},
author = {Carr, M J and Romig, Jr, A D},
abstractNote = {An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Aug 05 00:00:00 EDT 1987},
month = {Wed Aug 05 00:00:00 EDT 1987}
}
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