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Title: Normal incidence x-ray mirror for chemical microanalysis

Abstract

An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.

Inventors:
;
Issue Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (USA)
OSTI Identifier:
6761509
Patent Number(s):
-US-A6081964
Assignee:
SNL; ERA-14-001599; EDB-88-186307
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; MIRRORS; DESIGN; X-RAY EQUIPMENT; ABSORPTION; ELECTRON BEAMS; INVENTIONS; X-RAY FLUORESCENCE ANALYSIS; BEAMS; CHEMICAL ANALYSIS; EQUIPMENT; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; X-RAY EMISSION ANALYSIS 440300* -- Miscellaneous Instruments-- (-1989)

Citation Formats

Carr, M.J., and Romig, A.D. Jr. Normal incidence x-ray mirror for chemical microanalysis. United States: N. p., 1987. Web.
Carr, M.J., & Romig, A.D. Jr. Normal incidence x-ray mirror for chemical microanalysis. United States.
Carr, M.J., and Romig, A.D. Jr. Wed . "Normal incidence x-ray mirror for chemical microanalysis". United States.
@article{osti_6761509,
title = {Normal incidence x-ray mirror for chemical microanalysis},
author = {Carr, M.J. and Romig, A.D. Jr.},
abstractNote = {An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {8}
}