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Title: Large angle solid state position sensitive x-ray detector system

Abstract

A method and apparatus are disclosed for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided. 7 figs.

Inventors:
;
Issue Date:
Research Org.:
Advanced Technology Materials
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
672577
Patent Number(s):
5784432
Application Number:
PAN: 8-916,378; TRN: 99:001056
Assignee:
Penn State Research Foundation, University Park, PA (United States); Advanced Technology Materials, Inc., Danbury, CT (United States)
DOE Contract Number:  
FG05-92ER81327
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 21 Jul 1998
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; X-RAY DETECTION; MEASURING METHODS; POSITION SENSITIVE DETECTORS; SCINTILLATION COUNTERS; PHOTODETECTORS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS

Citation Formats

Kurtz, D S, and Ruud, C O. Large angle solid state position sensitive x-ray detector system. United States: N. p., 1998. Web.
Kurtz, D S, & Ruud, C O. Large angle solid state position sensitive x-ray detector system. United States.
Kurtz, D S, and Ruud, C O. Tue . "Large angle solid state position sensitive x-ray detector system". United States.
@article{osti_672577,
title = {Large angle solid state position sensitive x-ray detector system},
author = {Kurtz, D S and Ruud, C O},
abstractNote = {A method and apparatus are disclosed for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided. 7 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {7}
}