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Title: Instrument and method for focusing x rays, gamma rays, and neutrons

Abstract

A crystal-diffraction instrument or diffraction-grating instrument is described with an improved crystalline structure or grating spacing structure having a face for receiving a beam of photons or neutrons and diffraction planar spacing or grating spacing along that face with the spacing increasing progressively along the face to provide a decreasing Bragg diffraction angle for a monochromatic radiation and thereby increasing the usable area and acceptance angle. The increased planar spacing for the diffraction crystal is provided by the use of a temperature differential across the line structures with different compositions, by an individual crystalline structure with a varying composition and thereby a changing planar spacing along its face, and by combinations of these techniques. The increased diffraction grating element spacing is generated during the fabrication of the diffraction grating by controlling the cutting tool that is cutting the grooves or controlling the laser beam, electron beam, or ion beam that is exposing the resist layer, etc. It is also possible to vary this variation in grating spacing by applying a thermal gradient to the diffraction grating in much the same manner as is done in the crystal-diffraction case.

Inventors:
Issue Date:
OSTI Identifier:
6458937
Application Number:
ON: DE83006881
Assignee:
ERA-08-018557; EDB-83-051630
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; GRATINGS; FABRICATION; MONOCHROMATORS; NEUTRON DIFFRACTOMETERS; X-RAY DIFFRACTOMETERS; BRAGG REFLECTION; FOCUSING; GAMMA RADIATION; MONOCRYSTALS; NEUTRON BEAMS; NEUTRON DIFFRACTION; X RADIATION; X-RAY DIFFRACTION; BEAMS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATIONS; REFLECTION; SCATTERING; 440300* - Miscellaneous Instruments- (-1989); 654003 - Radiation & Shielding Physics- Neutron Interactions with Matter; 654001 - Radiation & Shielding Physics- Radiation Physics, Shielding Calculations & Experiments

Citation Formats

Smither, R K. Instrument and method for focusing x rays, gamma rays, and neutrons. United States: N. p., 1982. Web.
Smither, R K. Instrument and method for focusing x rays, gamma rays, and neutrons. United States.
Smither, R K. Thu . "Instrument and method for focusing x rays, gamma rays, and neutrons". United States.
@article{osti_6458937,
title = {Instrument and method for focusing x rays, gamma rays, and neutrons},
author = {Smither, R K},
abstractNote = {A crystal-diffraction instrument or diffraction-grating instrument is described with an improved crystalline structure or grating spacing structure having a face for receiving a beam of photons or neutrons and diffraction planar spacing or grating spacing along that face with the spacing increasing progressively along the face to provide a decreasing Bragg diffraction angle for a monochromatic radiation and thereby increasing the usable area and acceptance angle. The increased planar spacing for the diffraction crystal is provided by the use of a temperature differential across the line structures with different compositions, by an individual crystalline structure with a varying composition and thereby a changing planar spacing along its face, and by combinations of these techniques. The increased diffraction grating element spacing is generated during the fabrication of the diffraction grating by controlling the cutting tool that is cutting the grooves or controlling the laser beam, electron beam, or ion beam that is exposing the resist layer, etc. It is also possible to vary this variation in grating spacing by applying a thermal gradient to the diffraction grating in much the same manner as is done in the crystal-diffraction case.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1982},
month = {3}
}