Optical-diffraction method for determining crystal orientation
Abstract
Disclosed is an optical diffraction technique for characterizing the three-dimensional orientation of a crystal sample. An arbitrary surface of the crystal sample is texture etched so as to generate a pseudo-periodic diffraction grating on the surface. A laser light beam is then directed onto the etched surface, and the reflected light forms a farfield diffraction pattern in reflection. Parameters of the diffraction pattern, such as the geometry and angular dispersion of the diffracted beam are then related to grating shape of the etched surface which is in turn related to crystal orientation. This technique may be used for examining polycrystalline silicon for use in solar cells.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 6350664
- Application Number:
- ON: DE83010479
- Assignee:
- EDB-83-074127
- DOE Contract Number:
- AC02-77CH00178
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; CRYSTALS; GRAIN ORIENTATION; MEASURING METHODS; SILICON SOLAR CELLS; INSPECTION; CRYSTAL DEFECTS; DIFFRACTION; DISLOCATIONS; GRATINGS; LASER RADIATION; LASERS; POLYCRYSTALS; SILICON; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; LINE DEFECTS; MICROSTRUCTURE; ORIENTATION; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATIONS; SCATTERING; SEMIMETALS; SOLAR CELLS; SOLAR EQUIPMENT; 140501* - Solar Energy Conversion- Photovoltaic Conversion
Citation Formats
Sopori, B L. Optical-diffraction method for determining crystal orientation. United States: N. p., 1982.
Web.
Sopori, B L. Optical-diffraction method for determining crystal orientation. United States.
Sopori, B L. Fri .
"Optical-diffraction method for determining crystal orientation". United States.
@article{osti_6350664,
title = {Optical-diffraction method for determining crystal orientation},
author = {Sopori, B L},
abstractNote = {Disclosed is an optical diffraction technique for characterizing the three-dimensional orientation of a crystal sample. An arbitrary surface of the crystal sample is texture etched so as to generate a pseudo-periodic diffraction grating on the surface. A laser light beam is then directed onto the etched surface, and the reflected light forms a farfield diffraction pattern in reflection. Parameters of the diffraction pattern, such as the geometry and angular dispersion of the diffracted beam are then related to grating shape of the etched surface which is in turn related to crystal orientation. This technique may be used for examining polycrystalline silicon for use in solar cells.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri May 07 00:00:00 EDT 1982},
month = {Fri May 07 00:00:00 EDT 1982}
}
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