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Title: Method for measuring the contour of a machined part

Abstract

A method is disclosed for measuring the contour of a machined part with a contour gage apparatus, having a probe assembly including a probe tip for providing a measure of linear displacement of the tip on the surface of the part. The contour gage apparatus may be moved into and out of position for measuring the part while the part is still carried on the machining apparatus. Relative positions between the part and the probe tip may be changed, and a scanning operation is performed on the machined part by sweeping the part with the probe tip, whereby data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip are recorded. The method further allows real-time adjustment of the apparatus machining the part, including real-time adjustment of the machining apparatus in response to wear of the tool that occurs during machining. 5 figs.

Inventors:
Issue Date:
Research Org.:
Rockwell International Corp., Canoga Park, CA (United States)
OSTI Identifier:
63455
Patent Number(s):
5419222
Application Number:
PAN: 8-145,537
Assignee:
Dept. of Energy, Washington, DC (United States)
DOE Contract Number:  
AC04-76DP03533
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 30 May 1995
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATION; MACHINE TOOLS; PROCESS CONTROL; MATERIALS; MEASURING METHODS; SHAPE; MACHINING; MEASURING INSTRUMENTS; POSITIONING; REAL TIME SYSTEMS

Citation Formats

Bieg, L F. Method for measuring the contour of a machined part. United States: N. p., 1995. Web.
Bieg, L F. Method for measuring the contour of a machined part. United States.
Bieg, L F. Tue . "Method for measuring the contour of a machined part". United States.
@article{osti_63455,
title = {Method for measuring the contour of a machined part},
author = {Bieg, L F},
abstractNote = {A method is disclosed for measuring the contour of a machined part with a contour gage apparatus, having a probe assembly including a probe tip for providing a measure of linear displacement of the tip on the surface of the part. The contour gage apparatus may be moved into and out of position for measuring the part while the part is still carried on the machining apparatus. Relative positions between the part and the probe tip may be changed, and a scanning operation is performed on the machined part by sweeping the part with the probe tip, whereby data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip are recorded. The method further allows real-time adjustment of the apparatus machining the part, including real-time adjustment of the machining apparatus in response to wear of the tool that occurs during machining. 5 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 30 00:00:00 EDT 1995},
month = {Tue May 30 00:00:00 EDT 1995}
}

Patent:
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