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Title: Photoconductive circuit element reflectometer

Abstract

A photoconductive reflectometer for characterizing semiconductor devices at millimeter wavelength frequencies where a first photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short first laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test. Second PCEs are connected along the transmission line to sample the signals on the transmission line when excited into conductance by short second laser light pulses, spaced apart in time a determinable period from the first laser light pulses. Electronic filters connected to each of the second PCEs act as low-pass filters and remove parasitic interference from the sampled signals and output the sampled signals in the form of slowed-motion images of the signals on the transmission line. 4 figs.

Inventors:
Issue Date:
Research Org.:
Los Alamos National Lab., NM (USA)
OSTI Identifier:
6330069
Patent Number(s):
-US-A7129210
Application Number:
ON: DE89010960
Assignee:
Dept. of Energy TIC; EDB-89-072805
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE; PHOTOCONDUCTORS; TESTING; DESIGN; ELECTRONIC CIRCUITS; INVENTIONS; MEASURING INSTRUMENTS; REFLECTION; REFLECTIVITY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SURFACE PROPERTIES; 440300* - Miscellaneous Instruments- (-1989); 360603 - Materials- Properties

Citation Formats

Rauscher, C. Photoconductive circuit element reflectometer. United States: N. p., 1987. Web.
Rauscher, C. Photoconductive circuit element reflectometer. United States.
Rauscher, C. Mon . "Photoconductive circuit element reflectometer". United States.
@article{osti_6330069,
title = {Photoconductive circuit element reflectometer},
author = {Rauscher, C.},
abstractNote = {A photoconductive reflectometer for characterizing semiconductor devices at millimeter wavelength frequencies where a first photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short first laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test. Second PCEs are connected along the transmission line to sample the signals on the transmission line when excited into conductance by short second laser light pulses, spaced apart in time a determinable period from the first laser light pulses. Electronic filters connected to each of the second PCEs act as low-pass filters and remove parasitic interference from the sampled signals and output the sampled signals in the form of slowed-motion images of the signals on the transmission line. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {12}
}