Application accelerator system having bunch control
Abstract
An application accelerator system for monitoring the gain of a free electron laser is disclosed. Coherent Synchrotron Radiation (CSR) detection techniques are used with a bunch length monitor for ultra short, picosec to several tens of femtosec, electron bunches. The monitor employs an application accelerator, a coherent radiation production device, an optical or beam chopping device, an infrared radiation collection device, a narrow-banding filter, an infrared detection device, and a control. 1 fig.
- Inventors:
- Issue Date:
- Sponsoring Org.:
- USDOE; USDOE, Washington, DC (United States)
- OSTI Identifier:
- 6163245
- Patent Number(s):
- 5914492
- Application Number:
- PPN: US 8-911753
- Assignee:
- Southeastern Universities Research Association, Inc., Newport News, VA (United States)
- DOE Contract Number:
- AC05-84ER40150
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 15 Aug 1997
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; 43 PARTICLE ACCELERATORS; ACCELERATORS; COHERENT RADIATION; DESIGN; DIAGNOSTIC TECHNIQUES; FREE ELECTRON LASERS; GAIN; INFRARED RADIATION; OPTICAL SYSTEMS; SYNCHROTRON RADIATION; USES; AMPLIFICATION; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; LASERS; RADIATIONS; 426002* - Engineering- Lasers & Masers- (1990-); 430100 - Particle Accelerators- Design, Development, & Operation
Citation Formats
Wang, D, and Krafft, G A. Application accelerator system having bunch control. United States: N. p., 1999.
Web.
Wang, D, & Krafft, G A. Application accelerator system having bunch control. United States.
Wang, D, and Krafft, G A. Tue .
"Application accelerator system having bunch control". United States.
@article{osti_6163245,
title = {Application accelerator system having bunch control},
author = {Wang, D and Krafft, G A},
abstractNote = {An application accelerator system for monitoring the gain of a free electron laser is disclosed. Coherent Synchrotron Radiation (CSR) detection techniques are used with a bunch length monitor for ultra short, picosec to several tens of femtosec, electron bunches. The monitor employs an application accelerator, a coherent radiation production device, an optical or beam chopping device, an infrared radiation collection device, a narrow-banding filter, an infrared detection device, and a control. 1 fig.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {6}
}
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