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Title: Application accelerator system having bunch control

Abstract

An application accelerator system for monitoring the gain of a free electron laser is disclosed. Coherent Synchrotron Radiation (CSR) detection techniques are used with a bunch length monitor for ultra short, picosec to several tens of femtosec, electron bunches. The monitor employs an application accelerator, a coherent radiation production device, an optical or beam chopping device, an infrared radiation collection device, a narrow-banding filter, an infrared detection device, and a control. 1 fig.

Inventors:
;
Issue Date:
Sponsoring Org.:
USDOE; USDOE, Washington, DC (United States)
OSTI Identifier:
6163245
Patent Number(s):
5914492 A
Application Number:
PPN: US 8-911753
Assignee:
Southeastern Universities Research Association, Inc., Newport News, VA (United States) PTO; EDB-99-080921
DOE Contract Number:  
AC05-84ER40150
Resource Type:
Patent
Resource Relation:
Patent File Date: 15 Aug 1997
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 43 PARTICLE ACCELERATORS; ACCELERATORS; COHERENT RADIATION; DESIGN; DIAGNOSTIC TECHNIQUES; FREE ELECTRON LASERS; GAIN; INFRARED RADIATION; OPTICAL SYSTEMS; SYNCHROTRON RADIATION; USES; AMPLIFICATION; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; LASERS; RADIATIONS; 426002* - Engineering- Lasers & Masers- (1990-); 430100 - Particle Accelerators- Design, Development, & Operation

Citation Formats

Wang, D., and Krafft, G.A. Application accelerator system having bunch control. United States: N. p., 1999. Web.
Wang, D., & Krafft, G.A. Application accelerator system having bunch control. United States.
Wang, D., and Krafft, G.A. Tue . "Application accelerator system having bunch control". United States.
@article{osti_6163245,
title = {Application accelerator system having bunch control},
author = {Wang, D. and Krafft, G.A.},
abstractNote = {An application accelerator system for monitoring the gain of a free electron laser is disclosed. Coherent Synchrotron Radiation (CSR) detection techniques are used with a bunch length monitor for ultra short, picosec to several tens of femtosec, electron bunches. The monitor employs an application accelerator, a coherent radiation production device, an optical or beam chopping device, an infrared radiation collection device, a narrow-banding filter, an infrared detection device, and a control. 1 fig.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {6}
}