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Title: Superlattice strain gage

Abstract

A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element. 8 figs.

Inventors:
; ;
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
OSTI Identifier:
6045619
Patent Number(s):
7212854
Application Number:
ON: DE89011805
Assignee:
Dept. of Energy
Patent Classifications (CPCs):
A - HUMAN NECESSITIES A61 - MEDICAL OR VETERINARY SCIENCE A61N - ELECTROTHERAPY
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 36 MATERIALS SCIENCE; STRAIN GAGES; DESIGN; ALUMINIUM; ARSENIC; CRYSTAL GROWTH; CRYSTAL LATTICES; GALLIUM; INDIUM; INVENTIONS; PIEZOELECTRICITY; STRAINS; SUBSTRATES; CRYSTAL STRUCTURE; ELECTRICITY; ELEMENTS; MEASURING INSTRUMENTS; METALS; SEMIMETALS; 420200* - Engineering- Facilities, Equipment, & Techniques; 360603 - Materials- Properties

Citation Formats

Noel, B. W., Smith, D. L., and Sinha, D. N.. Superlattice strain gage. United States: N. p., 1988. Web.
Noel, B. W., Smith, D. L., & Sinha, D. N.. Superlattice strain gage. United States.
Noel, B. W., Smith, D. L., and Sinha, D. N.. Tue . "Superlattice strain gage". United States. https://www.osti.gov/servlets/purl/6045619.
@article{osti_6045619,
title = {Superlattice strain gage},
author = {Noel, B. W. and Smith, D. L. and Sinha, D. N.},
abstractNote = {A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element. 8 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1988},
month = {6}
}