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Title: Laser metrology for coherent multi-telescope arrays

Abstract

In multi-telescope arrays that comprise multiple telescopes, a beam-combining module, and flat mirrors for directing light beams from the multiple telescopes to the beam combining module, a laser metrology system is used for monitoring various pathlengths along a beam path where deviations are likely. Some pathlengths are defined simply by a pair of retroreflectors or reflectors at both ends. Lengths between pairs of retroreflectors are measured and monitored by laser interferometers. One critical pathlength deviation is related to the displacement of the flat mirror. A reference frame is set up relative to the beam-combining module to form and define the coordinate system within which the positions of the flat mirrors are measured and monitored. In the preferred embodiment, a pair of retroreflectors along the optical axis of the beam-combining module defines a reference frame. A triangle is formed by the reference frame as the base and another retroreflector at the flat mirror as the vertex. The triangle is used to monitor the position of the flat mirror. A beam's pathlength is dynamically corrected in response to the monitored deviations.

Inventors:
;
Issue Date:
OSTI Identifier:
6036455
Patent Number(s):
5208654
Application Number:
PPN: US 7-524114
Assignee:
Dept. of Energy, Washington, DC (United States)
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Resource Relation:
Patent File Date: 16 May 1990
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; TELESCOPES; ALIGNMENT; CORRECTIONS; DISTANCE; ELECTROMAGNETIC RADIATION; INTERFEROMETERS; MIRRORS; MONITORING; POSITIONING; MEASURING INSTRUMENTS; RADIATIONS; 440600* - Optical Instrumentation- (1990-)

Citation Formats

Shao, M, and Massie, N A. Laser metrology for coherent multi-telescope arrays. United States: N. p., 1993. Web.
Shao, M, & Massie, N A. Laser metrology for coherent multi-telescope arrays. United States.
Shao, M, and Massie, N A. Tue . "Laser metrology for coherent multi-telescope arrays". United States.
@article{osti_6036455,
title = {Laser metrology for coherent multi-telescope arrays},
author = {Shao, M and Massie, N A},
abstractNote = {In multi-telescope arrays that comprise multiple telescopes, a beam-combining module, and flat mirrors for directing light beams from the multiple telescopes to the beam combining module, a laser metrology system is used for monitoring various pathlengths along a beam path where deviations are likely. Some pathlengths are defined simply by a pair of retroreflectors or reflectors at both ends. Lengths between pairs of retroreflectors are measured and monitored by laser interferometers. One critical pathlength deviation is related to the displacement of the flat mirror. A reference frame is set up relative to the beam-combining module to form and define the coordinate system within which the positions of the flat mirrors are measured and monitored. In the preferred embodiment, a pair of retroreflectors along the optical axis of the beam-combining module defines a reference frame. A triangle is formed by the reference frame as the base and another retroreflector at the flat mirror as the vertex. The triangle is used to monitor the position of the flat mirror. A beam's pathlength is dynamically corrected in response to the monitored deviations.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1993},
month = {5}
}