Quantitative determination of mineral composition by powder x-ray diffraction

Title: Quantitative determination of mineral composition by powder x-ray diffraction

Full Record
Other Related Research

Abstract

An external standard intensity ratio method is used for quantitatively determining mineralogic compositions of samples by x-ray diffraction. The method uses ratios of x-ray intensity peaks from a single run. Constants are previously determined for each mineral which is to be quantitatively measured. Ratios of the highest intensity peak of each mineral to be quantified in the sample and the highest intensity peak of a reference mineral contained in the sample are used to calculate sample composition.

Inventors:: Pawloski, G A

Issue Date:: 1984-08-10

Research Org.:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

OSTI Identifier:: 5619792

Application Number:: ON: DE85011654

Assignee:: Dept. of Energy

DOE Contract Number:: W-7405-ENG-48

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; QUANTITATIVE CHEMICAL ANALYSIS; X-RAY DIFFRACTION; MINERALS; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; SCATTERING; 440300* - Miscellaneous Instruments- (-1989)

Citation Formats


                    Pawloski, G A. Quantitative determination of mineral composition by powder x-ray diffraction.  United States: N. p., 1984. 
        Web.

Copy to clipboard


                    Pawloski, G A. Quantitative determination of mineral composition by powder x-ray diffraction.  United States.

Copy to clipboard


                    Pawloski, G A. Fri .  
        "Quantitative determination of mineral composition by powder x-ray diffraction".  United States.

Copy to clipboard


                    
@article{osti_5619792,

  title        = {Quantitative determination of mineral composition by powder x-ray diffraction},

  author       = {Pawloski, G A},

  abstractNote = {An external standard intensity ratio method is used for quantitatively determining mineralogic compositions of samples by x-ray diffraction. The method uses ratios of x-ray intensity peaks from a single run. Constants are previously determined for each mineral which is to be quantitatively measured. Ratios of the highest intensity peak of each mineral to be quantified in the sample and the highest intensity peak of a reference mineral contained in the sample are used to calculate sample composition.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1984},

  month        = {8}

}

Copy to clipboard

Patent:

Search for the full text at the U.S. Patent and Trademark Office

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE Patents and OSTI.GOV collections:

Quantitative determination of mineral composition by powder X-ray diffraction

Patent Pawloski, Gayle A [Livermore, CA]

An external standard intensity ratio method is used for quantitatively determining mineralogic compositions of samples by x-ray diffraction. The method uses ratios of x-ray intensity peaks from a single run. Constants are previously determined for each mineral which is to be quantitatively measured. Ratios of the highest intensity peak of each mineral to be quantified in the sample and the highest intensity peak of a reference mineral contained in the sample are used to calculate sample composition.
Full Text Available
Quantitative determination of minerals in Nevada Test Site samples by x-ray diffraction

Conference Pawloski, G A

The external standard intensity ratio technique has been developed into a routine procedure for quantitatively determining mineralogic compositions of Nevada Test Site (NTS) samples by x-ray diffraction. This technique used ratios of x-ray intensity peaks from the same run which eliminates many possible errors. Constants have been determined for each of thirteen minerals commonly found in NTS samples - quartz, montmorillonite, illite, clinoptilolite, cristobalite, feldspars, calcite, dolomite, hornblende, kaolinite, muscovite, biotite, and amorphous glass. Ratios of the highest intensity peak of each mineral to be quantified in the sample and the highest intensity peak of quartz are used to calculatemore »« less
Full Text Available
X-ray filter for x-ray powder diffraction

Patent Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie C. D.; ...

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and wallsmore »« less
Full Text Available
X-ray filter for x-ray powder diffraction

Patent Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie Christine Dominique; ...

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and wallsmore »« less
Full Text Available
Method for improving x-ray diffraction determinations of residual stress in nickel-base alloys

Patent Berman, R. M.; Cohen, I.

A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys is discussed. Part of a predetermined area of the surface of a nickel-base alloy is covered with a dispersion. This exposes the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose, since it masks off unsatisfactory signals such that only amore »« less
Full Text Available

Similar Records