skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Ultrafast scanning probe microscopy

Abstract

An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

Inventors:
; ; ;
Issue Date:
Research Org.:
University of California
OSTI Identifier:
55814
Patent Number(s):
5,416,327
Application Number:
PAN: 8-145,993
Assignee:
University of California, Oakland, CA (United States)
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 16 May 1995
Country of Publication:
United States
Language:
English
Subject:
40 CHEMISTRY; SCANNING ELECTRON MICROSCOPY; PERFORMANCE; RESOLUTION; PULSE TECHNIQUES; RESPONSE FUNCTIONS

Citation Formats

Weiss, S, Chemla, D S, Ogletree, D F, and Botkin, D. Ultrafast scanning probe microscopy. United States: N. p., 1995. Web.
Weiss, S, Chemla, D S, Ogletree, D F, & Botkin, D. Ultrafast scanning probe microscopy. United States.
Weiss, S, Chemla, D S, Ogletree, D F, and Botkin, D. Tue . "Ultrafast scanning probe microscopy". United States.
@article{osti_55814,
title = {Ultrafast scanning probe microscopy},
author = {Weiss, S and Chemla, D S and Ogletree, D F and Botkin, D},
abstractNote = {An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {5}
}