skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Process for measuring degradation of sulfur hexafluoride in high voltage systems

Abstract

This invention is a method of detecting the presence of toxic and corrosive by-products in high voltage systems produced by electrically induced degradation of SF/sub 6/ insulating gas in the presence of certain impurities. It is an improvement over previous methods because it is extremely sensitive, detecting by-products present in parts per billion concentrations, and because the device employed is of a simple design and takes advantage of the by-products natural affinity for fluoride ions. The method employs an ion-molecule reaction cell in which negative ions of the by-products are produced by fluorine attachment. These ions are admitted to a negative ion mass spectrometer and identified by their spectra. This spectrometry technique is an improvement over conventional techniques because the negative ion peaks are strong and not obscured by a major ion spectra of the SF/sub 6/ component as is the case in positive ion mass spectrometry.

Inventors:
Issue Date:
Research Org.:
Oak Ridge National Lab., TN (USA)
OSTI Identifier:
5455493
Application Number:
ON: DE86013808
Assignee:
Dept. of Energy TIC; EDB-86-145767
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; CHEMICAL ANALYSIS; MASS SPECTROSCOPY; MASS SPECTROMETERS; SULFUR FLUORIDES; DECOMPOSITION; CHEMICAL REACTIONS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; MEASURING INSTRUMENTS; SPECTROMETERS; SPECTROSCOPY; SULFUR COMPOUNDS; 440300* - Miscellaneous Instruments- (-1989); 400104 - Spectral Procedures- (-1987)

Citation Formats

Sauers, I. Process for measuring degradation of sulfur hexafluoride in high voltage systems. United States: N. p., 1985. Web.
Sauers, I. Process for measuring degradation of sulfur hexafluoride in high voltage systems. United States.
Sauers, I. Tue . "Process for measuring degradation of sulfur hexafluoride in high voltage systems". United States.
@article{osti_5455493,
title = {Process for measuring degradation of sulfur hexafluoride in high voltage systems},
author = {Sauers, I.},
abstractNote = {This invention is a method of detecting the presence of toxic and corrosive by-products in high voltage systems produced by electrically induced degradation of SF/sub 6/ insulating gas in the presence of certain impurities. It is an improvement over previous methods because it is extremely sensitive, detecting by-products present in parts per billion concentrations, and because the device employed is of a simple design and takes advantage of the by-products natural affinity for fluoride ions. The method employs an ion-molecule reaction cell in which negative ions of the by-products are produced by fluorine attachment. These ions are admitted to a negative ion mass spectrometer and identified by their spectra. This spectrometry technique is an improvement over conventional techniques because the negative ion peaks are strong and not obscured by a major ion spectra of the SF/sub 6/ component as is the case in positive ion mass spectrometry.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {4}
}