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Title: Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus

Abstract

A fixture is provided for supporting and aligning small samples of material on a goniometer for x-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the x-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an x-ray diffraction apparatus previously limited to the analysis of much larger samples.

Inventors:
;
Issue Date:
Research Org.:
Martin Marietta Energy Systems, Inc., Oak Ridge, TN (USA)
OSTI Identifier:
5453961
Application Number:
ON: DE86013807
Assignee:
Dept. of energy TIC; ERA-11-005231; EDB-86-137223
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; GONIOMETERS; SAMPLE HOLDERS; DESIGN; POSITIONING; SUPPORTS; X-RAY DIFFRACTION; COHERENT SCATTERING; DIFFRACTION; MEASURING INSTRUMENTS; MECHANICAL STRUCTURES; SCATTERING; 420200* - Engineering- Facilities, Equipment, & Techniques

Citation Formats

Green, L.A., and Heck, J.L. Jr. Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus. United States: N. p., 1985. Web.
Green, L.A., & Heck, J.L. Jr. Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus. United States.
Green, L.A., and Heck, J.L. Jr. Tue . "Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus". United States.
@article{osti_5453961,
title = {Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus},
author = {Green, L.A. and Heck, J.L. Jr.},
abstractNote = {A fixture is provided for supporting and aligning small samples of material on a goniometer for x-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the x-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an x-ray diffraction apparatus previously limited to the analysis of much larger samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {4}
}