Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus
Abstract
A fixture is provided for supporting and aligning small samples of material on a goniometer for x-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the x-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an x-ray diffraction apparatus previously limited to the analysis of much larger samples.
- Inventors:
- Issue Date:
- Research Org.:
- Martin Marietta Energy Systems, Inc., Oak Ridge, TN (USA)
- OSTI Identifier:
- 5453961
- Application Number:
- ON: DE86013807
- Assignee:
- Dept. of energy
- DOE Contract Number:
- AC05-84OR21400
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; GONIOMETERS; SAMPLE HOLDERS; DESIGN; POSITIONING; SUPPORTS; X-RAY DIFFRACTION; COHERENT SCATTERING; DIFFRACTION; MEASURING INSTRUMENTS; MECHANICAL STRUCTURES; SCATTERING; 420200* - Engineering- Facilities, Equipment, & Techniques
Citation Formats
Green, L A, and Heck, Jr, J L. Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus. United States: N. p., 1985.
Web.
Green, L A, & Heck, Jr, J L. Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus. United States.
Green, L A, and Heck, Jr, J L. Tue .
"Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus". United States.
@article{osti_5453961,
title = {Fixture for supporting and aligning a sample to be analyzed in an x-ray diffraction apparatus},
author = {Green, L A and Heck, Jr, J L},
abstractNote = {A fixture is provided for supporting and aligning small samples of material on a goniometer for x-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the x-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an x-ray diffraction apparatus previously limited to the analysis of much larger samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {4}
}
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