Predicting threshold and location of laser damage on optical surfaces
Abstract
Disclosed is an apparatus useful in the prediction of the damage threshold of various optical devices, the location of weak spots on such devices and the location, identification, and elimination of optical surface impurities. The apparatus comprises a focused and pulsed laser, a photo electric detector/imaging means, and a timer. The weak spots emit photoelectrons when subjected to laser intensities that are less than the intensity actually required to produce the damage. The weak spots may be eliminated by sustained exposure to the laser beam.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 5411429
- Application Number:
- ON: DE85017793
- Assignee:
- Dept. of Energy
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; OPTICAL EQUIPMENT; LASER RADIATION; ELECTRONS; PHOTOEMISSION; SURFACES; TESTING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; EQUIPMENT; FERMIONS; LEPTONS; RADIATIONS; SECONDARY EMISSION; 420500* - Engineering- Materials Testing
Citation Formats
Siekhaus, W. Predicting threshold and location of laser damage on optical surfaces. United States: N. p., 1985.
Web.
Siekhaus, W. Predicting threshold and location of laser damage on optical surfaces. United States.
Siekhaus, W. Mon .
"Predicting threshold and location of laser damage on optical surfaces". United States.
@article{osti_5411429,
title = {Predicting threshold and location of laser damage on optical surfaces},
author = {Siekhaus, W},
abstractNote = {Disclosed is an apparatus useful in the prediction of the damage threshold of various optical devices, the location of weak spots on such devices and the location, identification, and elimination of optical surface impurities. The apparatus comprises a focused and pulsed laser, a photo electric detector/imaging means, and a timer. The weak spots emit photoelectrons when subjected to laser intensities that are less than the intensity actually required to produce the damage. The weak spots may be eliminated by sustained exposure to the laser beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {2}
}
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