Predicting threshold and location of laser damage on optical surfaces

Title: Predicting threshold and location of laser damage on optical surfaces

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Abstract

Disclosed is an apparatus useful in the prediction of the damage threshold of various optical devices, the location of weak spots on such devices and the location, identification, and elimination of optical surface impurities. The apparatus comprises a focused and pulsed laser, a photo electric detector/imaging means, and a timer. The weak spots emit photoelectrons when subjected to laser intensities that are less than the intensity actually required to produce the damage. The weak spots may be eliminated by sustained exposure to the laser beam.

Inventors:: Siekhaus, W.

Issue Date:: 1985-02-04

Research Org.:: Lawrence Livermore National Lab., CA (USA)

OSTI Identifier:: 5411429

Application Number:: ON: DE85017793

Assignee:: Dept. of Energy EDB-85-148847

DOE Contract Number:: W-7405-ENG-48

Resource Type:: Patent

Resource Relation:: Other Information: Portions of this document are illegible in microfiche products

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING; OPTICAL EQUIPMENT; LASER RADIATION; ELECTRONS; PHOTOEMISSION; SURFACES; TESTING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; EQUIPMENT; FERMIONS; LEPTONS; RADIATIONS; SECONDARY EMISSION; 420500* - Engineering- Materials Testing

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                    Siekhaus, W. Predicting threshold and location of laser damage on optical surfaces.  United States: N. p., 1985. 
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                    Siekhaus, W. Predicting threshold and location of laser damage on optical surfaces.  United States.

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                    Siekhaus, W. Mon .  
        "Predicting threshold and location of laser damage on optical surfaces".  United States.

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@article{osti_5411429,

  title        = {Predicting threshold and location of laser damage on optical surfaces},

  author       = {Siekhaus, W.},

  abstractNote = {Disclosed is an apparatus useful in the prediction of the damage threshold of various optical devices, the location of weak spots on such devices and the location, identification, and elimination of optical surface impurities. The apparatus comprises a focused and pulsed laser, a photo electric detector/imaging means, and a timer. The weak spots emit photoelectrons when subjected to laser intensities that are less than the intensity actually required to produce the damage. The weak spots may be eliminated by sustained exposure to the laser beam.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1985},

  month        = {2}

}

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