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Title: Phase comparator apparatus and method

Abstract

This invention finds especially useful application for interferometer measurements made in plasma fusion devices (e.g., for measuring the line integral of electron density in the plasma). Such interferometers typically use very high intermediate frequencies (e.g., on the order of 10 to 70 MHz) and therefore the phase comparison circuitry should be a high speed circuit with a linear transfer characteristic so as to accurately differentiate between small fractions of interference fringes.

Inventors:
Issue Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
OSTI Identifier:
5306123
Application Number:
ON: DE85017791
Assignee:
Dept. of Energy
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; PLASMA DIAGNOSTICS; INTERFEROMETRY; ELECTROMAGNETIC RADIATION; PLASMA DENSITY; SPECIFICATIONS; RADIATIONS; 700102* - Fusion Energy- Plasma Research- Diagnostics

Citation Formats

Coffield, F E. Phase comparator apparatus and method. United States: N. p., 1985. Web.
Coffield, F E. Phase comparator apparatus and method. United States.
Coffield, F E. Fri . "Phase comparator apparatus and method". United States.
@article{osti_5306123,
title = {Phase comparator apparatus and method},
author = {Coffield, F E},
abstractNote = {This invention finds especially useful application for interferometer measurements made in plasma fusion devices (e.g., for measuring the line integral of electron density in the plasma). Such interferometers typically use very high intermediate frequencies (e.g., on the order of 10 to 70 MHz) and therefore the phase comparison circuitry should be a high speed circuit with a linear transfer characteristic so as to accurately differentiate between small fractions of interference fringes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Feb 01 00:00:00 EST 1985},
month = {Fri Feb 01 00:00:00 EST 1985}
}

Patent:
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