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Title: Apparatus for laser beam profile measurements

Abstract

Apparatus for measuring the spatial intensity profile of the output beam from a continuous-wave laser oscillator. The rapid and repetitive passing of a small aperture through the otherwise totally blocked output beam of the laser under investigation provides an easily interpretable, real-time measure of the intensity characteristics thereof when detected by a single detector and the signal generated thereby displayed on an oscilloscope synthronized to the motion of the aperture.

Inventors:
;
Issue Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
OSTI Identifier:
5231703
Application Number:
ON: DE85017789
Assignee:
Dept. of Energy
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; LASER RADIATION; MEASURING INSTRUMENTS; BEAM PULSERS; ELECTROMAGNETIC RADIATION; RADIATIONS; 440300* - Miscellaneous Instruments- (-1989)

Citation Formats

Barnes, N P, and Gettemy, D J. Apparatus for laser beam profile measurements. United States: N. p., 1985. Web.
Barnes, N P, & Gettemy, D J. Apparatus for laser beam profile measurements. United States.
Barnes, N P, and Gettemy, D J. Wed . "Apparatus for laser beam profile measurements". United States.
@article{osti_5231703,
title = {Apparatus for laser beam profile measurements},
author = {Barnes, N P and Gettemy, D J},
abstractNote = {Apparatus for measuring the spatial intensity profile of the output beam from a continuous-wave laser oscillator. The rapid and repetitive passing of a small aperture through the otherwise totally blocked output beam of the laser under investigation provides an easily interpretable, real-time measure of the intensity characteristics thereof when detected by a single detector and the signal generated thereby displayed on an oscilloscope synthronized to the motion of the aperture.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {1}
}

Patent:
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