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Title: Compact mass spectrometer for plasma discharge ion analysis

Abstract

A mass spectrometer and methods are disclosed for mass spectrometry which are useful in characterizing a plasma. This mass spectrometer for determining type and quantity of ions present in a plasma is simple, compact, and inexpensive. It accomplishes mass analysis in a single step, rather than the usual two-step process comprised of ion extraction followed by mass filtering. Ions are captured by a measuring element placed in a plasma and accelerated by a known applied voltage. Captured ions are bent into near-circular orbits by a magnetic field such that they strike a collector, producing an electric current. Ion orbits vary with applied voltage and proton mass ratio of the ions, so that ion species may be identified. Current flow provides an indication of quantity of ions striking the collector. 7 figs.

Inventors:
Issue Date:
Research Org.:
Univ. of California (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
516924
Patent Number(s):
5650618
Application Number:
PAN: 8-568,899
Assignee:
Univ. of California, Los Alamos, NM (United States)
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 22 Jul 1997
Country of Publication:
United States
Language:
English
Subject:
40 CHEMISTRY; MASS SPECTROMETERS; PLASMA DIAGNOSTICS; DESIGN; MASS SPECTROSCOPY; IONS; IONIC COMPOSITION; PLASMA

Citation Formats

Tuszewski, M G. Compact mass spectrometer for plasma discharge ion analysis. United States: N. p., 1997. Web.
Tuszewski, M G. Compact mass spectrometer for plasma discharge ion analysis. United States.
Tuszewski, M G. Tue . "Compact mass spectrometer for plasma discharge ion analysis". United States.
@article{osti_516924,
title = {Compact mass spectrometer for plasma discharge ion analysis},
author = {Tuszewski, M G},
abstractNote = {A mass spectrometer and methods are disclosed for mass spectrometry which are useful in characterizing a plasma. This mass spectrometer for determining type and quantity of ions present in a plasma is simple, compact, and inexpensive. It accomplishes mass analysis in a single step, rather than the usual two-step process comprised of ion extraction followed by mass filtering. Ions are captured by a measuring element placed in a plasma and accelerated by a known applied voltage. Captured ions are bent into near-circular orbits by a magnetic field such that they strike a collector, producing an electric current. Ion orbits vary with applied voltage and proton mass ratio of the ions, so that ion species may be identified. Current flow provides an indication of quantity of ions striking the collector. 7 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 22 00:00:00 EDT 1997},
month = {Tue Jul 22 00:00:00 EDT 1997}
}

Patent:
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