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Title: Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner

Abstract

An ultra short (<10 ps), high power laser pulse is temporally characterized by a system that uses a physical measurement of a wavefront that has been altered in a known manner. The system includes a first reflection switch to remove a portion of a pulse from a beam of pulses, then includes a second reflection switch, operating in a mode that is opposite to the first reflection switch, to slice off a portion of that removed portion. The sliced portion is then directed to a measuring device for physical measurement. The two reflection switches are arranged with respect to each other and with respect to the beam of ultra short pulses such that physical measurement of the sliced portion is related to the temporal measurement of the ultra short pulse by a geometric or trigonometric relationship. The reflection switches are operated by a control pulse that is directed to impinge on each of the reflection switches at a 90[degree] angle of incidence. 8 figures.

Inventors:
Issue Date:
OSTI Identifier:
5031398
Patent Number(s):
5293397
Application Number:
PPN: US 7-980710
Assignee:
Associated Universities, Inc., Washington, DC (United States)
DOE Contract Number:  
AC02-76CH00016
Resource Type:
Patent
Resource Relation:
Patent File Date: 24 Nov 1992
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; LASER RADIATION; DIAGNOSTIC TECHNIQUES; CONTROL; ELECTROMAGNETIC PULSES; POSITIONING; ELECTROMAGNETIC RADIATION; PULSES; RADIATIONS; 426002* - Engineering- Lasers & Masers- (1990-)

Citation Formats

Veligdan, J T. Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner. United States: N. p., 1994. Web.
Veligdan, J T. Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner. United States.
Veligdan, J T. Tue . "Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner". United States.
@article{osti_5031398,
title = {Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner},
author = {Veligdan, J T},
abstractNote = {An ultra short (<10 ps), high power laser pulse is temporally characterized by a system that uses a physical measurement of a wavefront that has been altered in a known manner. The system includes a first reflection switch to remove a portion of a pulse from a beam of pulses, then includes a second reflection switch, operating in a mode that is opposite to the first reflection switch, to slice off a portion of that removed portion. The sliced portion is then directed to a measuring device for physical measurement. The two reflection switches are arranged with respect to each other and with respect to the beam of ultra short pulses such that physical measurement of the sliced portion is related to the temporal measurement of the ultra short pulse by a geometric or trigonometric relationship. The reflection switches are operated by a control pulse that is directed to impinge on each of the reflection switches at a 90[degree] angle of incidence. 8 figures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {3}
}

Patent:
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