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Title: METHOD FOR MEASURING RADIATION

Abstract

A method for measuring an unknown integrated quantity of radiation with a condenser ionization chamber is described. The chamber is initially charged to a predetermined voltage by a voltage source. The chamber is then removed from the source and exposed to an unknown quantity of radiation for a period of time. The quantity of radiation to which the chamber was exposed is then measured by detecting the magnitude of the pulse of current necessary to recharge the chamber of its initial value through a suitable impedance. The current pulse is amplified and measured directly by a suitable pulse height analyzing system. (AEC)

Inventors:
;
Issue Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4823258
Patent Number(s):
3010021
Assignee:
U.S. Atomic Energy Commission
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
NSA Number:
NSA-16-000387
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-62
Country of Publication:
United States
Language:
English
Subject:
ENGINEERING AND EQUIPMENT; AMPLIFIERS; ELECTRIC POTENTIAL; ELECTRICITY; IONIZATION CHAMBERS; MEASURED VALUES; PLANNING; PULSE ANALYZERS; PULSES; RADIATION DETECTORS; RADIATION DOSES; RADIATION SOURCES

Citation Formats

Roesch, W C, and McCall, R C. METHOD FOR MEASURING RADIATION. United States: N. p., 1961. Web.
Roesch, W C, & McCall, R C. METHOD FOR MEASURING RADIATION. United States.
Roesch, W C, and McCall, R C. Tue . "METHOD FOR MEASURING RADIATION". United States.
@article{osti_4823258,
title = {METHOD FOR MEASURING RADIATION},
author = {Roesch, W C and McCall, R C},
abstractNote = {A method for measuring an unknown integrated quantity of radiation with a condenser ionization chamber is described. The chamber is initially charged to a predetermined voltage by a voltage source. The chamber is then removed from the source and exposed to an unknown quantity of radiation for a period of time. The quantity of radiation to which the chamber was exposed is then measured by detecting the magnitude of the pulse of current necessary to recharge the chamber of its initial value through a suitable impedance. The current pulse is amplified and measured directly by a suitable pulse height analyzing system. (AEC)},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1961},
month = {11}
}

Patent:
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