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Title: SEMICONDUCTOR X-RAY EMISSION SPECTROMETER.

Inventors:
; ; ;
Issue Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4823141
Patent Number(s):
3433954
Assignee:
(to United States Atomic Energy Commission). DTIE; NSA-23-016141
NSA Number:
NSA-23-016141
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-69
Country of Publication:
United States
Language:
English
Subject:
N26120* -Instrumentation-Radiation Detection Instruments- Nuclear Spectroscopic Instrumentation; DESIGN; SEMICONDUCTORS; SPECTROMETERS; X RADIATION; X-RAY SPECTROMETERS/design using high-resolution semiconductor detectors; RADIATION DETECTORS, SEMICONDUCTOR/design for x-ray spectroscopy

Citation Formats

Bowman, H.R., Thompson, S.G., Hyde, E.K., and Jared, R.C. SEMICONDUCTOR X-RAY EMISSION SPECTROMETER.. United States: N. p., 1969. Web.
Bowman, H.R., Thompson, S.G., Hyde, E.K., & Jared, R.C. SEMICONDUCTOR X-RAY EMISSION SPECTROMETER.. United States.
Bowman, H.R., Thompson, S.G., Hyde, E.K., and Jared, R.C. Wed . "SEMICONDUCTOR X-RAY EMISSION SPECTROMETER.". United States.
@article{osti_4823141,
title = {SEMICONDUCTOR X-RAY EMISSION SPECTROMETER.},
author = {Bowman, H.R. and Thompson, S.G. and Hyde, E.K. and Jared, R.C.},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1969},
month = {1}
}