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Title: MEASURING IRRADIATION-INDUCED DEFORMATIONS OF MATERIALS.

Inventors:
Issue Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4713367
Patent Number(s):
3577199
Assignee:
(to United States Atomic Energy Commission).
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G - PHYSICS G01 - MEASURING G01D - MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
NSA Number:
NSA-25-049491
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-71
Country of Publication:
United States
Language:
English
Subject:
N30150* -Metals, Ceramics, & Other Materials-Metals & Alloys-Radiation Effects; N30250 -Metals, Ceramics, & Other Materials-Ceramics & Cermets-Radiation Effects; DEFORMATION; IRRADIATION; MEASURING METHODS; PATENT; RADIATION EFFECTS; SOLIDS; RADIATION/effects on deformation of materials, equipment and method for measuring; SOLIDS/radioinduced deformation of, equipment and method for measuring

Citation Formats

Schultz, W W. MEASURING IRRADIATION-INDUCED DEFORMATIONS OF MATERIALS.. United States: N. p., 1971. Web.
Schultz, W W. MEASURING IRRADIATION-INDUCED DEFORMATIONS OF MATERIALS.. United States.
Schultz, W W. Fri . "MEASURING IRRADIATION-INDUCED DEFORMATIONS OF MATERIALS.". United States.
@article{osti_4713367,
title = {MEASURING IRRADIATION-INDUCED DEFORMATIONS OF MATERIALS.},
author = {Schultz, W W},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1971},
month = {1}
}

Patent:
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