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Title: ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.

Inventors:
;
Issue Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4687443
Patent Number(s):
3662589
Assignee:
(to United States Atomic Energy Commission). TIC; NSA-26-045469
NSA Number:
NSA-26-045469
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-72
Country of Publication:
United States
Language:
English
Subject:
N42400* -Engineering-Materials Testing; DEFECTS; METALS; MHZ RANGE; PULSE ANALYZERS; SIZE; SPECTRA; ULTRASONIC TESTING; ULTRASONIC WAVES; WAVE PROPAGATION; ULTRASONIC TESTING/method for determining location and size of defects in metals using frequency analysis system; METALS/defects in, ultrasonic method using frequency analysis system for locating and sizing

Citation Formats

Adler, L., and Whaley, H.L. ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.. United States: N. p., 1972. Web.
Adler, L., & Whaley, H.L. ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.. United States.
Adler, L., and Whaley, H.L. Sat . "ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.". United States.
@article{osti_4687443,
title = {ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.},
author = {Adler, L. and Whaley, H.L.},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1972},
month = {1}
}