ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.
- Inventors:
- Issue Date:
- Research Org.:
- Originating Research Org. not identified
- OSTI Identifier:
- 4687443
- Patent Number(s):
- 3662589
- Assignee:
- (to United States Atomic Energy Commission).
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- NSA Number:
- NSA-26-045469
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-72
- Country of Publication:
- United States
- Language:
- English
- Subject:
- N42400* -Engineering-Materials Testing; DEFECTS; METALS; MHZ RANGE; PULSE ANALYZERS; SIZE; SPECTRA; ULTRASONIC TESTING; ULTRASONIC WAVES; WAVE PROPAGATION; ULTRASONIC TESTING/method for determining location and size of defects in metals using frequency analysis system; METALS/defects in, ultrasonic method using frequency analysis system for locating and sizing
Citation Formats
Adler, L, and Whaley, H L. ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.. United States: N. p., 1972.
Web.
Adler, L, & Whaley, H L. ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.. United States.
Adler, L, and Whaley, H L. Sat .
"ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.". United States.
@article{osti_4687443,
title = {ULTRASONIC FLAW DETERMINATION BY SPECTRAL ANALYSIS.},
author = {Adler, L and Whaley, H L},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1972},
month = {1}
}
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