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Title: GAMMA RAY THICKNESS GAGES

Inventors:
; ;
Issue Date:
OSTI Identifier:
4670171
Patent Number(s):
3076894
Assignee:
U.S. Atomic Energy Commission
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
NSA Number:
NSA-19-009469
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-65
Country of Publication:
United States
Language:
English
Subject:
INSTRUMENTATION; General; GAGES; GAMMA DETECTION; GAMMA RADIATION; GAMMA SOURCES; INSTRUMENTS; MEASURED VALUES; METALS; PLANNING; PULSE ANALYZERS; SCATTERING; THICKNESS

Citation Formats

Putman, J L, Jefferson, S, and Owen, R B. GAMMA RAY THICKNESS GAGES. United States: N. p., 1963. Web.
Putman, J L, Jefferson, S, & Owen, R B. GAMMA RAY THICKNESS GAGES. United States.
Putman, J L, Jefferson, S, and Owen, R B. Fri . "GAMMA RAY THICKNESS GAGES". United States.
@article{osti_4670171,
title = {GAMMA RAY THICKNESS GAGES},
author = {Putman, J L and Jefferson, S and Owen, R B},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1963},
month = {2}
}