GAMMA RAY THICKNESS GAGES
- Inventors:
- Issue Date:
- OSTI Identifier:
- 4670171
- Patent Number(s):
- 3076894
- Assignee:
- U.S. Atomic Energy Commission
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- NSA Number:
- NSA-19-009469
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-65
- Country of Publication:
- United States
- Language:
- English
- Subject:
- INSTRUMENTATION; General; GAGES; GAMMA DETECTION; GAMMA RADIATION; GAMMA SOURCES; INSTRUMENTS; MEASURED VALUES; METALS; PLANNING; PULSE ANALYZERS; SCATTERING; THICKNESS
Citation Formats
Putman, J L, Jefferson, S, and Owen, R B. GAMMA RAY THICKNESS GAGES. United States: N. p., 1963.
Web.
Putman, J L, Jefferson, S, & Owen, R B. GAMMA RAY THICKNESS GAGES. United States.
Putman, J L, Jefferson, S, and Owen, R B. Fri .
"GAMMA RAY THICKNESS GAGES". United States.
@article{osti_4670171,
title = {GAMMA RAY THICKNESS GAGES},
author = {Putman, J L and Jefferson, S and Owen, R B},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1963},
month = {2}
}
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