ANGLED PLATE SCANNING INTERFEROMETER
- Inventors:
- Issue Date:
- Research Org.:
- Originating Research Org. not identified
- OSTI Identifier:
- 4582579
- Patent Number(s):
- 3217591
- Assignee:
- U.S. Atomic Energy Commission
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
- NSA Number:
- NSA-20-004232
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-66
- Country of Publication:
- United States
- Language:
- English
- Subject:
- INSTRUMENTATION; General; BEAMS; LIGHT; OPTICAL SYSTEMS; PLANNING; PLASMA; PLASMA DIAGNOSTICS; SPECTRAL SHIFT; SPECTROMETERS
Citation Formats
Gardner, A S, and Barr, W L. ANGLED PLATE SCANNING INTERFEROMETER. United States: N. p., 1965.
Web.
Gardner, A S, & Barr, W L. ANGLED PLATE SCANNING INTERFEROMETER. United States.
Gardner, A S, and Barr, W L. Tue .
"ANGLED PLATE SCANNING INTERFEROMETER". United States.
@article{osti_4582579,
title = {ANGLED PLATE SCANNING INTERFEROMETER},
author = {Gardner, A S and Barr, W L},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1965},
month = {11}
}
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