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Title: MATRIX CORRECTED X-RAY FLUOROMETRIC ANALYSIS METHOD.

Inventors:
;
Issue Date:
OSTI Identifier:
4518482
Patent Number(s):
3375369
Assignee:
(to United States Atomic Energy Commission).
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
NSA Number:
NSA-22-027616
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-68
Country of Publication:
United States
Language:
English
Subject:
N20130* -Chemistry-Analytical & Separations Chemistry- Radiometric & Radiochemical Procedures; CHEMICAL ANALYSIS; ERRORS; FLUORESCENCE; X RADIATION; X-RAY FLUORESCENCE ANALYSIS/sensitivity of, matrix correction for improving; ELEMENTS/determination by x-ray fluorescence methods, matrix corrections in

Citation Formats

Goldman, M, and Anderson, R P. MATRIX CORRECTED X-RAY FLUOROMETRIC ANALYSIS METHOD.. United States: N. p., 1968. Web.
Goldman, M, & Anderson, R P. MATRIX CORRECTED X-RAY FLUOROMETRIC ANALYSIS METHOD.. United States.
Goldman, M, and Anderson, R P. Mon . "MATRIX CORRECTED X-RAY FLUOROMETRIC ANALYSIS METHOD.". United States.
@article{osti_4518482,
title = {MATRIX CORRECTED X-RAY FLUOROMETRIC ANALYSIS METHOD.},
author = {Goldman, M and Anderson, R P},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1968},
month = {1}
}