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Title: MICROWAVE PLASMA DENSITY MEASUREMENT SYSTEM

Inventors:
Issue Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4512320
Patent Number(s):
3265967
Assignee:
U.S. Atomic Energy Commission DTIE; NSA-20-038338
NSA Number:
NSA-20-038338
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-66
Country of Publication:
United States
Language:
English
Subject:
PHYSICS; Plasma Physics and Thermonuclear Processes

Citation Formats

Heald, M.A. MICROWAVE PLASMA DENSITY MEASUREMENT SYSTEM. United States: N. p., 1966. Web.
Heald, M.A. MICROWAVE PLASMA DENSITY MEASUREMENT SYSTEM. United States.
Heald, M.A. Mon . "MICROWAVE PLASMA DENSITY MEASUREMENT SYSTEM". United States.
@article{osti_4512320,
title = {MICROWAVE PLASMA DENSITY MEASUREMENT SYSTEM},
author = {Heald, M.A.},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1966},
month = {8}
}