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Title: Impedance sensing of flaws in non-homogeneous materials

Abstract

An apparatus and method are disclosed for sensing impedances of materials placed in contact therewith. The invention comprises a plurality of drive electrodes and one or more sense electrodes. Both rotating electric fields and differently shaped electric fields are provided for, as are analysis of structure and composition at different orientations and depths. 10 figs.

Inventors:
Issue Date:
Research Org.:
AT&T Corporation
OSTI Identifier:
441874
Patent Number(s):
5,602,486
Application Number:
PAN: 8-336,999
Assignee:
Sandia Corp., Albuquerque, NM (United States)
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 11 Feb 1997
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; ELECTRICAL TESTING; DEFECTS; MEASURING METHODS; ELECTRODES; ELECTRIC FIELDS; IMPEDANCE

Citation Formats

Novak, J L. Impedance sensing of flaws in non-homogeneous materials. United States: N. p., 1997. Web.
Novak, J L. Impedance sensing of flaws in non-homogeneous materials. United States.
Novak, J L. Tue . "Impedance sensing of flaws in non-homogeneous materials". United States.
@article{osti_441874,
title = {Impedance sensing of flaws in non-homogeneous materials},
author = {Novak, J L},
abstractNote = {An apparatus and method are disclosed for sensing impedances of materials placed in contact therewith. The invention comprises a plurality of drive electrodes and one or more sense electrodes. Both rotating electric fields and differently shaped electric fields are provided for, as are analysis of structure and composition at different orientations and depths. 10 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {2}
}