Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material
Abstract
A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.
- Inventors:
- Issue Date:
- Research Org.:
- AT&T
- OSTI Identifier:
- 426627
- Patent Number(s):
- 5594240
- Application Number:
- PAN: 8-407,148
- Assignee:
- Dept. of Energy, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Resource Relation:
- Other Information: PBD: 14 Jan 1997
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; VOLTMETERS; DESIGN; CRYSTALS; PIEZOELECTRICITY; ELECTRO-OPTICAL EFFECTS; MAGNETOSTRICTION; OPERATION
Citation Formats
Weiss, J D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States: N. p., 1997.
Web.
Weiss, J D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States.
Weiss, J D. Tue .
"Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material". United States.
@article{osti_426627,
title = {Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material},
author = {Weiss, J D},
abstractNote = {A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {1}
}
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