Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

Title: Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

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Abstract

A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.

Inventors:: Weiss, J D

Issue Date:: 1997-01-14

Research Org.:: AT&T Corporation

OSTI Identifier:: 426627

Patent Number(s):: 5,594,240

Application Number:: PAN: 8-407,148

Assignee:: Dept. of Energy, Washington, DC (United States)

DOE Contract Number:: AC04-76DP00789

Resource Type:: Patent

Resource Relation:: Other Information: PBD: 14 Jan 1997

Country of Publication:: United States

Language:: English

Subject:: 44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; VOLTMETERS; DESIGN; CRYSTALS; PIEZOELECTRICITY; ELECTRO-OPTICAL EFFECTS; MAGNETOSTRICTION; OPERATION

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                    Weiss, J D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material.  United States: N. p., 1997. 
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                    Weiss, J D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material.  United States.

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                    Weiss, J D. Tue .  
        "Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material".  United States.

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@article{osti_426627,

  title        = {Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material},

  author       = {Weiss, J D},

  abstractNote = {A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1997},

  month        = {1}

}

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