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Title: Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.
Inventors:
Issue Date:
OSTI Identifier:
426627
Assignee:
Dept. of Energy, Washington, DC (United States) SNL; SCA: 440800; PA: EDB-97:028731; SN: 97001724495
Patent Number(s):
US 5,594,240/A/
Application Number:
PAN: 8-407,148
Contract Number:
AC04-76DP00789
Resource Relation:
Other Information: PBD: 14 Jan 1997
Research Org:
AT&T Corporation
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; VOLTMETERS; DESIGN; CRYSTALS; PIEZOELECTRICITY; ELECTRO-OPTICAL EFFECTS; MAGNETOSTRICTION; OPERATION