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Title: Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

Abstract

A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.

Inventors:
Issue Date:
Research Org.:
AT&T Corporation
OSTI Identifier:
426627
Patent Number(s):
5,594,240
Application Number:
PAN: 8-407,148
Assignee:
Dept. of Energy, Washington, DC (United States)
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 14 Jan 1997
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; VOLTMETERS; DESIGN; CRYSTALS; PIEZOELECTRICITY; ELECTRO-OPTICAL EFFECTS; MAGNETOSTRICTION; OPERATION

Citation Formats

Weiss, J D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States: N. p., 1997. Web.
Weiss, J D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States.
Weiss, J D. Tue . "Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material". United States.
@article{osti_426627,
title = {Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material},
author = {Weiss, J D},
abstractNote = {A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {1}
}