Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material
A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.
- Issue Date:
- OSTI Identifier:
- 426627
- Assignee:
- Dept. of Energy, Washington, DC (United States) SNL; SCA: 440800; PA: EDB-97:028731; SN: 97001724495
- Patent Number(s):
- US 5,594,240/A/
- Application Number:
- PAN: 8-407,148
- Contract Number:
- AC04-76DP00789
- Resource Relation:
- Other Information: PBD: 14 Jan 1997
- Research Org:
- AT&T Corporation
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; VOLTMETERS; DESIGN; CRYSTALS; PIEZOELECTRICITY; ELECTRO-OPTICAL EFFECTS; MAGNETOSTRICTION; OPERATION