ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.
- Inventors:
- Issue Date:
- Research Org.:
- Originating Research Org. not identified
- OSTI Identifier:
- 4182436
- Patent Number(s):
- 3488494
- Assignee:
- (to United States Atomic Energy Commission).
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- NSA Number:
- NSA-24-019272
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-70
- Country of Publication:
- United States
- Language:
- English
- Subject:
- N26400* -Instrumentation-Miscellaneous Instruments & Components; ATOMIC BEAMS; ATOMS; BEAMS; DESIGN; ION BEAMS; MICROSCOPES; PARTICLE MICROSCOPES/design of
Citation Formats
Tobias, C A. ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.. United States: N. p., 1970.
Web.
Tobias, C A. ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.. United States.
Tobias, C A. Thu .
"ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.". United States.
@article{osti_4182436,
title = {ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.},
author = {Tobias, C A},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 1970},
month = {Thu Jan 01 00:00:00 EST 1970}
}
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