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Title: ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.

Inventors:
Issue Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4182436
Patent Number(s):
3488494
Assignee:
(to United States Atomic Energy Commission). DTIE; NSA-24-019272
NSA Number:
NSA-24-019272
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-70
Country of Publication:
United States
Language:
English
Subject:
N26400* -Instrumentation-Miscellaneous Instruments & Components; ATOMIC BEAMS; ATOMS; BEAMS; DESIGN; ION BEAMS; MICROSCOPES; PARTICLE MICROSCOPES/design of

Citation Formats

Tobias, C.A. ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.. United States: N. p., 1970. Web.
Tobias, C.A. ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.. United States.
Tobias, C.A. Thu . "ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.". United States.
@article{osti_4182436,
title = {ION MICROSCOPE: THE IMAGE OF WHICH REPRESENTS THE INTENSITY OF SECONDARY RADIATION AS A FUNCTION OF THE POSITION OF THE PRIMARY IONS CAUSING THE RADIATION.},
author = {Tobias, C.A.},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1970},
month = {1}
}