VERNIER CHRONOTRON UTILIZING AT LEAST TWO SHORTED DELAY LINES
Abstract
An improved vernier chronotron featuring pulse-forming circuits of a ringing'' or back and forth'' oscillatory type is described. A delay line shorted at both ends together with transistor circuitry to introduce a pulse into that line and also to provide reinforcement of the pulse as it oscillates between the pulse-reflective extremities is provided. A transistorized coincidence circuit is also provided. Enhanced measurement of time intervals in the nanosecond range is afforded. (AEC)
- Inventors:
- Issue Date:
- Research Org.:
- Originating Research Org. not identified
- OSTI Identifier:
- 4083641
- Patent Number(s):
- 3122648
- Assignee:
- U.S. Atomic Energy Commission
- Patent Classifications (CPCs):
-
G - PHYSICS G04 - HOROLOGY G04F - TIME-INTERVAL MEASURING
- NSA Number:
- NSA-18-010361
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-64
- Country of Publication:
- United States
- Language:
- English
- Subject:
- INSTRUMENTATION; CABLES; CHRONOTRONS; CIRCUITS; COINCIDENCE METHODS; CONFIGURATION; DELAY LINES; MEASURED VALUES; OSCILLATIONS; PULSE ANALYZERS; PULSES; TRANSISTORS
Citation Formats
Rufer, R P. VERNIER CHRONOTRON UTILIZING AT LEAST TWO SHORTED DELAY LINES. United States: N. p., 1964.
Web.
Rufer, R P. VERNIER CHRONOTRON UTILIZING AT LEAST TWO SHORTED DELAY LINES. United States.
Rufer, R P. Tue .
"VERNIER CHRONOTRON UTILIZING AT LEAST TWO SHORTED DELAY LINES". United States.
@article{osti_4083641,
title = {VERNIER CHRONOTRON UTILIZING AT LEAST TWO SHORTED DELAY LINES},
author = {Rufer, R P},
abstractNote = {An improved vernier chronotron featuring pulse-forming circuits of a ringing'' or back and forth'' oscillatory type is described. A delay line shorted at both ends together with transistor circuitry to introduce a pulse into that line and also to provide reinforcement of the pulse as it oscillates between the pulse-reflective extremities is provided. A transistorized coincidence circuit is also provided. Enhanced measurement of time intervals in the nanosecond range is afforded. (AEC)},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1964},
month = {2}
}
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