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Title: Apparatus for controlling the scan width of a scanning laser beam

Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board. 8 figs.
Inventors:
Issue Date:
OSTI Identifier:
392656
Assignee:
Dept. of Energy, Washington, DC (United States) PTO; SCA: 400102; PA: EDB-96:166431; SN: 96001682423
Patent Number(s):
US 5,568,255/A/
Application Number:
PAN: 8-321,695
Contract Number:
W-7405-ENG-48
Resource Relation:
Other Information: PBD: 22 Oct 1996
Research Org:
University of California
Country of Publication:
United States
Language:
English
Subject:
40 CHEMISTRY; ABSORPTION SPECTROSCOPY; COMPUTERIZED CONTROL SYSTEMS; DESIGN; LASER RADIATION; RING LASERS; DYE LASERS; SEMICONDUCTOR LASERS; REAL TIME SYSTEMS; CAMAC SYSTEM