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Title: Method for imaging liquid and dielectric materials with scanning polarization force microscopy

Abstract

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

Inventors:
; ; ;
Issue Date:
Research Org.:
Univ. of California (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
335454
Patent Number(s):
5880360
Application Number:
PAN: 8-871,424
Assignee:
Univ. of California, Oakland, CA (United States)
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 9 Mar 1999
Country of Publication:
United States
Language:
English
Subject:
40 CHEMISTRY; DIELECTRIC MATERIALS; MICROSCOPY; POLARIZATION; LIQUIDS; DROPLETS

Citation Formats

Hu, J, Ogletree, D F, Salmeron, M, and Xiao, X. Method for imaging liquid and dielectric materials with scanning polarization force microscopy. United States: N. p., 1999. Web.
Hu, J, Ogletree, D F, Salmeron, M, & Xiao, X. Method for imaging liquid and dielectric materials with scanning polarization force microscopy. United States.
Hu, J, Ogletree, D F, Salmeron, M, and Xiao, X. Tue . "Method for imaging liquid and dielectric materials with scanning polarization force microscopy". United States.
@article{osti_335454,
title = {Method for imaging liquid and dielectric materials with scanning polarization force microscopy},
author = {Hu, J and Ogletree, D F and Salmeron, M and Xiao, X},
abstractNote = {The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {3}
}

Patent:
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