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Title: Optical method for the determination of stress in thin films

Abstract

A method and optical system is disclosed for measuring an amount of stress in a film layer disposed over a substrate. The method includes steps of: (A) applying a sequence of optical pump pulses to the film layer, individual ones of said optical pump pulses inducing a propagating strain pulse in the film layer, and for each of the optical pump pulses, applying at least one optical probe pulse, the optical probe pulses being applied with different time delays after the application of the corresponding optical probe pulses; (B) detecting variations in an intensity of a reflection of portions of the optical probe pulses, the variations being due at least in part to the propagation of the strain pulse in the film layer; (C) determining, from the detected intensity variations, a sound velocity in the film layer; and (D) calculating, using the determined sound velocity, the amount of stress in the film layer. In one embodiment of this invention the step of detecting measures a period of an oscillation in the intensity of the reflection of portions of the optical probe pulses, while in another embodiment the step of detecting measures a change in intensity of the reflection of portionsmore » of the optical probe pulses and determines a time at which the propagating strain pulse reflects from a boundary of the film layer. 16 figs.« less

Inventors:
Issue Date:
Research Org.:
Brown University
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
321300
Patent Number(s):
5,864,393
Application Number:
PAN: 8-902,695
Assignee:
Brown Univ. Research Foundation, Providence, RI (United States) PTO; SCA: 420500; PA: EDB-99:031220; SN: 99002064414
DOE Contract Number:  
FG02-86ER45267
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 26 Jan 1999
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; STRESS ANALYSIS; OPTICAL SYSTEMS; MEASURING METHODS; THIN FILMS; MATERIALS TESTING; TIME DELAY; VISIBLE RADIATION; REFLECTION

Citation Formats

Maris, H.J. Optical method for the determination of stress in thin films. United States: N. p., 1999. Web.
Maris, H.J. Optical method for the determination of stress in thin films. United States.
Maris, H.J. Tue . "Optical method for the determination of stress in thin films". United States.
@article{osti_321300,
title = {Optical method for the determination of stress in thin films},
author = {Maris, H.J.},
abstractNote = {A method and optical system is disclosed for measuring an amount of stress in a film layer disposed over a substrate. The method includes steps of: (A) applying a sequence of optical pump pulses to the film layer, individual ones of said optical pump pulses inducing a propagating strain pulse in the film layer, and for each of the optical pump pulses, applying at least one optical probe pulse, the optical probe pulses being applied with different time delays after the application of the corresponding optical probe pulses; (B) detecting variations in an intensity of a reflection of portions of the optical probe pulses, the variations being due at least in part to the propagation of the strain pulse in the film layer; (C) determining, from the detected intensity variations, a sound velocity in the film layer; and (D) calculating, using the determined sound velocity, the amount of stress in the film layer. In one embodiment of this invention the step of detecting measures a period of an oscillation in the intensity of the reflection of portions of the optical probe pulses, while in another embodiment the step of detecting measures a change in intensity of the reflection of portions of the optical probe pulses and determines a time at which the propagating strain pulse reflects from a boundary of the film layer. 16 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {1}
}