DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Electrical interconnect structure using metal bridges to interconnect die

Abstract

A multichip module comprises a carrier, a plurality of chips, an electrical insulating layer, and an electrical interconnect structure. The carrier includes a bottom wall and four side walls defining an internal cavity. The chips are positioned in the internal cavity, with each chip including a plurality of bond pads. The electrical insulating layer is formed from electrically insulating material and is positioned on an upper surface of the carrier and the chips. The electrical interconnect structure includes a plurality of interconnect traces, with each interconnect trace formed from electrically conductive material and electrically connected to a first bond pad on a first chip and a second bond pad on a second chip. Each interconnect trace includes a bridge having a segment that is spaced apart from, and positioned above, the electrical insulating layer.

Inventors:
; ; ;
Issue Date:
Research Org.:
Kansas City Plant (KCP), Kansas City, MO (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
2293839
Patent Number(s):
11810895
Application Number:
17/501,043
Assignee:
Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
DOE Contract Number:  
NA0002839
Resource Type:
Patent
Resource Relation:
Patent File Date: 10/14/2021
Country of Publication:
United States
Language:
English

Citation Formats

Young, Barbara Diane, Sedlock, Steven James, Ledden, Kevin Christopher, and Elliot, Alan Ahlberg. Electrical interconnect structure using metal bridges to interconnect die. United States: N. p., 2023. Web.
Young, Barbara Diane, Sedlock, Steven James, Ledden, Kevin Christopher, & Elliot, Alan Ahlberg. Electrical interconnect structure using metal bridges to interconnect die. United States.
Young, Barbara Diane, Sedlock, Steven James, Ledden, Kevin Christopher, and Elliot, Alan Ahlberg. Tue . "Electrical interconnect structure using metal bridges to interconnect die". United States. https://www.osti.gov/servlets/purl/2293839.
@article{osti_2293839,
title = {Electrical interconnect structure using metal bridges to interconnect die},
author = {Young, Barbara Diane and Sedlock, Steven James and Ledden, Kevin Christopher and Elliot, Alan Ahlberg},
abstractNote = {A multichip module comprises a carrier, a plurality of chips, an electrical insulating layer, and an electrical interconnect structure. The carrier includes a bottom wall and four side walls defining an internal cavity. The chips are positioned in the internal cavity, with each chip including a plurality of bond pads. The electrical insulating layer is formed from electrically insulating material and is positioned on an upper surface of the carrier and the chips. The electrical interconnect structure includes a plurality of interconnect traces, with each interconnect trace formed from electrically conductive material and electrically connected to a first bond pad on a first chip and a second bond pad on a second chip. Each interconnect trace includes a bridge having a segment that is spaced apart from, and positioned above, the electrical insulating layer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2023},
month = {11}
}

Works referenced in this record:

Embedded component package structure and method of manufacturing the same
patent, February 2018


Integrated fan-out structure and method of forming
patent, July 2019


On-chip RF shields with front side redistribution lines
patent, May 2012


Multi-sublayer dielectric layers
patent, December 1991


Hermetic high density interconnected electronic system
patent, October 1994


IR Assisted Fan-out Wafer Level Packaging Using Silicon Handler
patent-application, March 2020