High framerate and high dynamic range electron microscopy
Abstract
Methods and systems for acquiring transmission electron microscope video data on a rolling-shutter detector at an enhanced frame rate and without temporal distortions are described. Also described are methods to enhance the dynamic range of image and diffraction data acquired using a transmission electron microscope. The disclosed methods and systems may also be applicable to photon detection and imaging systems.
- Inventors:
- Issue Date:
- Research Org.:
- Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 2293794
- Patent Number(s):
- 11804359
- Application Number:
- 16/939,576
- Assignee:
- Integrated Dynamic Electron Solutions, Inc. (Pleasanton, CA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- SC0013104
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 07/27/2020
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Bloom, Ruth, Park, Sang Tae, Reed, Bryan, and Masiel, Daniel. High framerate and high dynamic range electron microscopy. United States: N. p., 2023.
Web.
Bloom, Ruth, Park, Sang Tae, Reed, Bryan, & Masiel, Daniel. High framerate and high dynamic range electron microscopy. United States.
Bloom, Ruth, Park, Sang Tae, Reed, Bryan, and Masiel, Daniel. Tue .
"High framerate and high dynamic range electron microscopy". United States. https://www.osti.gov/servlets/purl/2293794.
@article{osti_2293794,
title = {High framerate and high dynamic range electron microscopy},
author = {Bloom, Ruth and Park, Sang Tae and Reed, Bryan and Masiel, Daniel},
abstractNote = {Methods and systems for acquiring transmission electron microscope video data on a rolling-shutter detector at an enhanced frame rate and without temporal distortions are described. Also described are methods to enhance the dynamic range of image and diffraction data acquired using a transmission electron microscope. The disclosed methods and systems may also be applicable to photon detection and imaging systems.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2023},
month = {10}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing
patent, October 2015
- Reed, Bryan W.; DeHope, William J.; Huete, Glenn
- US Patent Document 9,165,743
Methods and apparatus for high speed camera
patent, September 2016
- Raskar, Ramesh; Barsi, Christopher
- US Patent Document 9,451,177
Image converter having separate and sequential switching of deflector plate potentials
patent, January 1986
- Huston, Alexander E.
- US Patent Document 4,565,923
Charged Particle Beam Apparatus
patent-application, September 2020
- Kawamoto, Yuta; Ikegami, Akira; Ebizuka, Yasushi
- US Patent Application 16/782521; 20200294757