Liveness as a factor to evaluate memory vulnerability to soft errors
Abstract
Memory, used by a computer to store data, is generally prone to faults, including permanent faults (i.e. relating to a lifetime of the memory hardware), and also transient faults (i.e. relating to some external cause) which are otherwise known as soft errors. Since soft errors can change the state of the data in the memory and thus cause errors in applications reading and processing the data, there is a desire to characterize the degree of vulnerability of the memory to soft errors. In particular, once the vulnerability for a particular memory to soft errors has been characterized, cost/reliability trade-offs can be determined, or soft error detection mechanisms (e.g. parity) may be selectively employed for the memory. In some cases, memory faults can be diagnosed by redundant execution and a diagnostic coverage may be determined.
- Inventors:
- Issue Date:
- Research Org.:
- Nvidia Corporation, Santa Clara, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 2222087
- Patent Number(s):
- 11720472
- Application Number:
- 17/522,417
- Assignee:
- Nvidia Corporation (Santa Clara, CA)
- DOE Contract Number:
- B620719
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 11/09/2021
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Bramley, Richard Gavin, Shirvani, Philip Payman, and Saxena, Nirmal R. Liveness as a factor to evaluate memory vulnerability to soft errors. United States: N. p., 2023.
Web.
Bramley, Richard Gavin, Shirvani, Philip Payman, & Saxena, Nirmal R. Liveness as a factor to evaluate memory vulnerability to soft errors. United States.
Bramley, Richard Gavin, Shirvani, Philip Payman, and Saxena, Nirmal R. Tue .
"Liveness as a factor to evaluate memory vulnerability to soft errors". United States. https://www.osti.gov/servlets/purl/2222087.
@article{osti_2222087,
title = {Liveness as a factor to evaluate memory vulnerability to soft errors},
author = {Bramley, Richard Gavin and Shirvani, Philip Payman and Saxena, Nirmal R.},
abstractNote = {Memory, used by a computer to store data, is generally prone to faults, including permanent faults (i.e. relating to a lifetime of the memory hardware), and also transient faults (i.e. relating to some external cause) which are otherwise known as soft errors. Since soft errors can change the state of the data in the memory and thus cause errors in applications reading and processing the data, there is a desire to characterize the degree of vulnerability of the memory to soft errors. In particular, once the vulnerability for a particular memory to soft errors has been characterized, cost/reliability trade-offs can be determined, or soft error detection mechanisms (e.g. parity) may be selectively employed for the memory. In some cases, memory faults can be diagnosed by redundant execution and a diagnostic coverage may be determined.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2023},
month = {8}
}
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