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Title: Quantum dot microscope apparatus comprising a nanoscale semiconductor on the tip of a fiber, a tunneling electrical lead and a capacitive electrical lead on the fiber

Abstract

A quantum dot microscope apparatus is provided. A further aspect employs a tilted or tapered end or tip on a microscopic probe. Another aspect of the present apparatus employs a probe including a quantum dot with only one tunneling lead connected to a power source. A manufacturing aspect includes creating a tapered or asymmetrically shaped specimen-facing end of a probe where a quantum dot is located on the end. A further manufacturing aspect includes using focused ion-beam milling to create a tip or end of a quantum dot microscope probe.

Inventors:
; ;
Issue Date:
Research Org.:
Michigan State Univ., East Lansing, MI (United States); Univ. of Wisconsin, Madison, WI (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
2221944
Patent Number(s):
11693024
Application Number:
17/493,998
Assignee:
Board of Trustees of Michigan State University (East Lansing, MI); Wisconsin Alumni Research Foundation (Madison, WI)
DOE Contract Number:  
SC0017888
Resource Type:
Patent
Resource Relation:
Patent File Date: 10/05/2021
Country of Publication:
United States
Language:
English

Citation Formats

Tessmer, Stuart Holden, Goodwin, Eric William, and Levchenko, Oleksandr. Quantum dot microscope apparatus comprising a nanoscale semiconductor on the tip of a fiber, a tunneling electrical lead and a capacitive electrical lead on the fiber. United States: N. p., 2023. Web.
Tessmer, Stuart Holden, Goodwin, Eric William, & Levchenko, Oleksandr. Quantum dot microscope apparatus comprising a nanoscale semiconductor on the tip of a fiber, a tunneling electrical lead and a capacitive electrical lead on the fiber. United States.
Tessmer, Stuart Holden, Goodwin, Eric William, and Levchenko, Oleksandr. Tue . "Quantum dot microscope apparatus comprising a nanoscale semiconductor on the tip of a fiber, a tunneling electrical lead and a capacitive electrical lead on the fiber". United States. https://www.osti.gov/servlets/purl/2221944.
@article{osti_2221944,
title = {Quantum dot microscope apparatus comprising a nanoscale semiconductor on the tip of a fiber, a tunneling electrical lead and a capacitive electrical lead on the fiber},
author = {Tessmer, Stuart Holden and Goodwin, Eric William and Levchenko, Oleksandr},
abstractNote = {A quantum dot microscope apparatus is provided. A further aspect employs a tilted or tapered end or tip on a microscopic probe. Another aspect of the present apparatus employs a probe including a quantum dot with only one tunneling lead connected to a power source. A manufacturing aspect includes creating a tapered or asymmetrically shaped specimen-facing end of a probe where a quantum dot is located on the end. A further manufacturing aspect includes using focused ion-beam milling to create a tip or end of a quantum dot microscope probe.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2023},
month = {7}
}

Works referenced in this record:

A simple low-dissipation amplifier for cryogenic STM
journal, February 2002


Scanning single electron transistor microscope for imaging ambient temperature objects
patent, February 2003


Focused ion-beam fabrication of fiber probes with well-defined apertures for use in near-field scanning optical microscopy
journal, June 1998


A low-temperature scanning tunneling microscope capable of microscopy and spectroscopy in a Bitter magnet at up to 34 T
journal, September 2017


A method to control the fabrication of etched optical fiber probes with nanometric tips
journal, December 2009


Subsurface charge accumulation imaging of a quantum Hall liquid
journal, March 1998