Truncated non-linear interferometer-based sensor system
Abstract
A truncated non-linear interferometer-based sensor system includes an input that receives an optical beam and a non-linear amplifier that generates a probe beam and a conjugate beam from the optical beam. The system's local oscillators are related to the probe beam and the conjugate beam. The system includes a sensor that transduces an input with the probe beam and the conjugate beam. The transduction detects changes in the phase of each of the probe beam and the conjugate beam. The system's phase sensitive detectors detect phase modulations between the respective local oscillators, the probe beam, and the conjugate beam and outputs phase signals based on detected phase modulations. The system measures phase signals indicative of the sensor's input resulting from a sum or difference of the phase signals. The measurement exhibits a quantum noise reduction in an intensity difference, a phase sum, or an amplitude difference quadrature.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1987069
- Patent Number(s):
- 11561453
- Application Number:
- 17/472,269
- Assignee:
- UT-Battelle LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 09/10/2021
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Pooser, Raphael C., Lawrie, Benjamin J., and Maksymovych, Petro. Truncated non-linear interferometer-based sensor system. United States: N. p., 2023.
Web.
Pooser, Raphael C., Lawrie, Benjamin J., & Maksymovych, Petro. Truncated non-linear interferometer-based sensor system. United States.
Pooser, Raphael C., Lawrie, Benjamin J., and Maksymovych, Petro. Tue .
"Truncated non-linear interferometer-based sensor system". United States. https://www.osti.gov/servlets/purl/1987069.
@article{osti_1987069,
title = {Truncated non-linear interferometer-based sensor system},
author = {Pooser, Raphael C. and Lawrie, Benjamin J. and Maksymovych, Petro},
abstractNote = {A truncated non-linear interferometer-based sensor system includes an input that receives an optical beam and a non-linear amplifier that generates a probe beam and a conjugate beam from the optical beam. The system's local oscillators are related to the probe beam and the conjugate beam. The system includes a sensor that transduces an input with the probe beam and the conjugate beam. The transduction detects changes in the phase of each of the probe beam and the conjugate beam. The system's phase sensitive detectors detect phase modulations between the respective local oscillators, the probe beam, and the conjugate beam and outputs phase signals based on detected phase modulations. The system measures phase signals indicative of the sensor's input resulting from a sum or difference of the phase signals. The measurement exhibits a quantum noise reduction in an intensity difference, a phase sum, or an amplitude difference quadrature.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2023},
month = {1}
}
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patent-application, September 2008
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Scanning probe microscope with slant detection and compensation
patent, November 1992
- Kajimura, Hiroshi
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